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Data processing method for accelerated degradation test of medical instrument core component

A technology for accelerated degradation test, medical device, applied in electrical digital data processing, special data processing applications, instruments, etc., can solve problems such as low reliability

Inactive Publication Date: 2018-02-23
广东科鉴检测工程技术有限公司 +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] Based on this, it is necessary to provide a data processing method for accelerated degradation test of core components of medical devices to solve the problem of low test reliability

Method used

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  • Data processing method for accelerated degradation test of medical instrument core component
  • Data processing method for accelerated degradation test of medical instrument core component
  • Data processing method for accelerated degradation test of medical instrument core component

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Embodiment Construction

[0014] The technical solution of the present invention will be described below in conjunction with the accompanying drawings.

[0015] Such as figure 1 As shown, the present invention provides a data processing method for accelerated degradation test of core components of medical equipment, which may include the following steps:

[0016] S1, obtain the life characteristics of the core component samples of the medical device to be tested under different test stresses;

[0017] S2, respectively establish acceleration models for each test stress and its life characteristics, solve the acceleration models under each test stress, obtain the solution acceleration model, and calculate the core components of the medical device to be tested according to the normal test stress and the solution acceleration model The average life of the sample under normal test stress;

[0018] S3, establishing the life distribution of the core component samples of the medical device under test under n...

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Abstract

The invention relates to a data processing method of an accelerated degradation test. The method comprises the following steps of obtaining service life characteristics of a medical instrument core component sample to be tested under the effect of different test stresses; establishing an acceleration model of each test stress and service life characteristics of the test stress, solving the acceleration model under each test stress, obtaining a solution acceleration model, and calculating the average service life of the medical instrument core component sample to be tested under a normal test stress according to the normal test stress and the solution acceleration model; establishing the service life distribution of the medical instrument core component sample to be tested under the normaltest stress according to the average service life of the medical instrument core component sample to be tested under the normal test stress. By means of the method, the service life distribution of the medical instrument core component sample to be tested under the normal test stress can be obtained accurately, and therefore the reliability of the accelerated degradation test is effectively improved.

Description

technical field [0001] The invention relates to the technical field of accelerated degradation tests, in particular to a data processing method for accelerated degradation tests of core components of medical equipment. Background technique [0002] Accelerated degradation test is a life test method that shortens the test period by increasing the test stress. The accelerated degradation test method provides the basis for the reliability evaluation of high reliability and long life products. There are many types of accelerated degradation tests, and the following three types are commonly used: [0003] (1) Constant stress accelerated degradation test, referred to as constant stress test, that is, first select a set of accelerated stress levels, and then divide a certain number of samples into several groups, each group is subjected to a life test at a stress level, until each group has until a certain number of samples fail. [0004] (2) The step stress accelerated degradat...

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Application Information

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IPC IPC(8): G06F17/50G06F17/18
CPCG06F17/18G06F30/20G06F2119/04
Inventor 高军王红涛卢家锋文武陈婷
Owner 广东科鉴检测工程技术有限公司