Data processing method for accelerated degradation test of medical instrument core component
A technology for accelerated degradation test, medical device, applied in electrical digital data processing, special data processing applications, instruments, etc., can solve problems such as low reliability
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[0014] The technical solution of the present invention will be described below in conjunction with the accompanying drawings.
[0015] Such as figure 1 As shown, the present invention provides a data processing method for accelerated degradation test of core components of medical equipment, which may include the following steps:
[0016] S1, obtain the life characteristics of the core component samples of the medical device to be tested under different test stresses;
[0017] S2, respectively establish acceleration models for each test stress and its life characteristics, solve the acceleration models under each test stress, obtain the solution acceleration model, and calculate the core components of the medical device to be tested according to the normal test stress and the solution acceleration model The average life of the sample under normal test stress;
[0018] S3, establishing the life distribution of the core component samples of the medical device under test under n...
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