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Solar cell appearance defect identification method

A technology of appearance defect and recognition method, which is applied in the field of solar cell appearance defect recognition, to achieve the effect of reducing labor cost, reducing workload and improving recognition efficiency

Inactive Publication Date: 2018-03-06
上海太阳能工程技术研究中心有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The purpose of the present invention is to overcome the shortcomings of the need to manually identify the appearance defects of solar cells in the prior art, and provide a method for identifying defects in the appearance of solar cells

Method used

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  • Solar cell appearance defect identification method

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Embodiment Construction

[0017] The present invention will be further described in detail below in conjunction with test examples and specific embodiments. However, it should not be understood that the scope of the above subject matter of the present invention is limited to the following embodiments, and all technologies realized based on the content of the present invention belong to the scope of the present invention.

[0018] see figure 1 , the solar cell appearance defect identification method provided by the present invention, comprises the following steps:

[0019] Step 1: Collect the image of the image correction template for image correction.

[0020] Step 2: Collect the binarized image of the solar cell, and the cell and the background in the image can be clearly distinguished.

[0021] Step 3: Use the image of the image correction template to correct the image of the solar battery sheet with barrel distortion, and correct the curve deformation in the battery sheet to a straight line.

[0...

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Abstract

The invention discloses a solar cell appearance defect identification method. The method acquires a sample image of a solar cell slice, performs preprocessing such as distortion correction, rotation,and cropping on the image of the solar cell slice, then obtains the edge feature of the cell slice by an edge detection algorithm, determines whether there is a chipping or chipping and whether thereis any defect such as slurry contamination on the surface of the cell slice according to the shape and position of the feature, and then determines whether the cell has a broken gate defect by a straight line detection method. The method is based on the principles of machine vision system, image processing and feature analysis, replaces manual identification method, realizes the intelligent appearance defect sorting of the solar cell slice, is favorable for improving the appearance quality of the product, and reduces the labor cost.

Description

technical field [0001] The invention relates to photovoltaic technology, in particular to a method for identifying defects in the appearance of solar cells. Background technique [0002] During the production process of solar cells, due to various reasons, some appearance defects will occur on the surface. These defects have a great impact on the appearance, and even affect the conversion efficiency of the battery, burying hidden dangers. The appearance defects of the cells are sorted in the later stage of cell production or in the early stage of module packaging. At present, manual visual inspection is generally used in the industry to identify the appearance defects of solar cells, which has high labor costs, low production efficiency, and will cause visual fatigue, which will affect the identification effect. Therefore, cell production enterprises urgently need a fast, accurate, and efficient method for identifying defects in the appearance of solar cells in order to imp...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88
CPCG01N21/8851G01N2021/8887
Inventor 肖颖婕张梦亚赵墨丁叶飞朱小芳朱旭张雯君陆文婷
Owner 上海太阳能工程技术研究中心有限公司