High-temperature in-situ sample rod

Abstract

Disclosed in the invention is a high-temperature in-situ sample rod having a rod head for loading a sample and a hollow rod body. The rod head consists of a substrate and a three-dimensional piezoelectric actuator. The tail end of the substrate is fixed with the rod body; a slot for providing motion space for the three-dimensional piezoelectric actuator is formed in the substrate; a fixed electrode probe is fixed at the head of the substrate; a movable electrode pin is formed at the head of the three-dimensional piezoelectric actuator; and the fixed electrode pin and the movable electrode pinare connected with a power supply by respective wires respectively. With the high-temperature in-situ sample rod, a heating region can be controlled to be at a nanoscale; and the thermal drift is minimized.

Description

technical field [0001] The invention relates to the field of transmission electron microscope accessories, in particular to a sample rod of a transmission electron microscope. Background technique [0002] Transmission electron microscopy is a widely used tool for material characterization, which uses electron beams as the light source and has a resolution of 0.1 nm. In situ is a technology that describes the ongoing event or reaction process in real time and on site. "In situ" is intended to describe the way to measure the process, which is measured at the same time and place at the same time as the phenomenon of interest occurs, and is not related to other systems. Isolate or change the original conditions of the test. The application of in-situ means in the field of transmission electron microscopy is realized through in-situ sample rods. Designing and using different in-situ transmission electron microscope sample rods can exert various physical effects on the sample, ...

AI Technical Summary

Problems solved by technology

But its shortcomings are: 1. Using tungsten wire as the heating carrier, the sample is attached to the tungsten wire, and the heat from the tungsten wire is transferred to the sample. Due to the large heating area (the diameter of the tungsten wire is 25 microns, up to several millimeters) ), and the field of view of the transmission electron microscope is very small (the length and width are hundreds of nanometers at lower magnifications), so the thermal drift of the tungsten wire and the sample may make it difficult to observe during the heating process

2. The two electrodes are fixed, and the tungsten wire is located between the two electrodes. When the electrodes are energized, the whole tungsten wire generates heat, and the heated area is fixed. The entire sample chamber radiates the heat of the tungsten wire, even if the temperature measuring device is integrated on the sample rod. , there is also a deviation between the measured temperature and the temperature of a single sample, so that the sample temperature can only be judged by the special phenomenon of known temperature, and the actual temperature of the sample is unknown, so accurate temperature control cannot be achieved

But its disadvantages are: 1. Use carbon nanotubes as a heating carrier. Carbon nanotubes are laid between two pairs of electrodes, and the two pairs of electrodes are fixed. When the electrodes are energized, the whole carbon nanotubes will generate heat. Fixed, the entire sample cavity radiates the heat of the carbon nanotube network, even if the temperature measuring device is integrated on the sample rod, it measures the temperature of the entire carbon nanotube network. The temperature of the sample cavity deviates from the temperature of a single sample

The accuracy of this phenomenon judgment method is not high, neither can know the temperature at any time, nor can it be used as a basis to achieve accurate temperature control

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