Construction method of wheat leaf area index estimating model based on triple band vegetation index

A technology of leaf area index and vegetation index, which is applied in the direction of measuring devices, instruments, and optical devices, can solve problems such as limitations and operational difficulties, and achieve the effects of wide application range, simple estimation structure, and high precision

Active Publication Date: 2018-03-13
NANJING AGRICULTURAL UNIVERSITY
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Problems solved by technology

However, this method of determining the optimal band range by drawing equipotential lines needs to be realized by drawing 2D equipotential line distribution maps, so the current application of this method is limited to

Method used

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  • Construction method of wheat leaf area index estimating model based on triple band vegetation index
  • Construction method of wheat leaf area index estimating model based on triple band vegetation index
  • Construction method of wheat leaf area index estimating model based on triple band vegetation index

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[0055] The technical solution of the present invention will be further described below through specific embodiments.

[0056] The invention is based on wheat field trials in different years, different ecological sites, different nitrogen application levels, different water treatments and different planting densities. The specific expression is shown in Table 1:

[0057] Table 1 Basic information of wheat experimental fields for obtaining control data and inspection data

[0058]

[0059]

[0060] Obtain experimental data from wheat experimental fields Exp.1, Exp.2 and Exp.3 as a modeling data set. The modeling data acquisition is systematic, contains a large number of samples, involves many varieties, has a moderate average value, and has a large total distance. Covers rich information from low vegetation index to high vegetation index, which is used as a sample for constructing a model; experimental data is obtained from wheat experimental fields Exp.4, Exp.5, Exp.6, Exp.7 and Exp....

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Abstract

The invention discloses a construction method of a novel triple band vegetation index suitable for the estimation of a wheat leaf area index. The method comprises the following steps: normatively collecting the canopy reflectivity and leaf area index of wheat; based on a normalized vegetation index, establishing a novel triple band vegetation index form, using modeling data, adopting a random combination mode to determine optimal wavelengths and coefficients (k) of triple bands, obtaining an optimal triple band vegetation index suitable for estimating the wheat leaf area, and based on the optimal triple band vegetation index, establishing a wheat leaf area index estimating model. Independent experimental data is adopted to testify and verify the novel vegetation index and the estimating model. The constructed novel vegetation index has a simple structure; the established estimating model has high precision on estimating the wheat leaf index; and the saturation phenomenon is effectivelyavoided, when a crop leaf area index is high. The established estimating model can accurately estimate the leaf area index in real time without any loss in wheat production.

Description

technical field [0001] The invention belongs to the field of rapid and non-destructive monitoring of crop growth status based on reflectance spectrum, in particular to a method for constructing a wheat leaf area index estimation model based on three-band vegetation index. Background technique [0002] Leaf is an important plant organ, which not only participates in plant photosynthesis, transpiration and other important physiological and biochemical reactions, but also is the main place for plants to intercept light energy. Leaf area index (LAI) refers to the multiple of the total area of ​​plant leaves per unit land area compared to the land area, that is, the total area of ​​green leaves per unit land area. In agriculture, it reflects the growth of crop groups and the prediction of yield. Important indicators. The traditional measurement methods of leaf area index mainly include direct measurement method and indirect measurement method. The direct measurement method refer...

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Application Information

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IPC IPC(8): G01N21/25G01B11/28
CPCG01B11/28G01N21/25
Inventor 姚霞曹中盛程涛朱艳田永超马吉锋张羽王雪
Owner NANJING AGRICULTURAL UNIVERSITY
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