A kind of space camera cmos image sensor locking protection method and system

Abstract

The invention discloses a space camera CMOS image sensor locking protection system and method, which solves the problem that the existing system and method have a small application range, a fixed current limiting threshold, and it is difficult to match the locking current of the protected device and cannot make the protected device The device is out of the locked state, which is easy to cause misjudgment and affects the life of the CMOS image sensor. The space camera CMOS image sensor lock protection system consists of DC-DC module, magnetic latching relay, precision resistor, current-limiting low dropout regulator, precision operational amplifier, A / D conversion module, camera controller CPU, instruction driver and non-volatile Composition of lost memory. Space camera CMOS image sensor lock protection method starts A / D conversion at a frequency that is more than 10 times the highest fluctuation frequency of the CMOS image sensor operating current, and continuously samples two CMOS image sensor operating currents that exceed the longest fluctuation period, and the CMOS image sensor is normal The code value range corresponding to the work can be modified after the spacecraft is launched to avoid misjudgment.

Description

technical field [0001] The present invention generally relates to space cameras employing CMOS image sensors, and more particularly, to space camera CMOS image sensor lock protection systems and methods. Background technique [0002] Space cameras use spacecraft as observation platforms to image the Earth, the Moon, Mars and other celestial bodies. There are γ-rays, X-rays, electrons, protons, neutrons and various heavy ions in space (especially the space outside the earth’s atmosphere), and their radiation effects will damage the optoelectronic devices in the space camera, causing the space camera to work abnormally or malfunction. The radiation effects of space radiation on space cameras mainly include total radiation dose, single event effect and displacement effect. Among them, the single event effect refers to the instantaneous disturbance or permanent damage to the electronic device caused by the impact of a single high-energy particle. Lock-in effect (also known as...

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Problems solved by technology

[0007] The present invention aims at the space camera adopting the CMOS image sensor under the effect of the single particle lock-in effect, without protective measures, the large current generated by the low-resistance state may fuse the metal wires in the device, causing permanent damage, and even burn the device. It cannot be restored, and the existing methods have disadvantages such as small application range, fixed current limit threshold, difficulty in matching the locked current of the protected device, unable to make the protected device out of the locked state, easy to cause misjudgment, and affect the life of the CMOS image sensor. , provide a space camera CMOS image sensor lock protection system and method

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