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Detection system and detection method of safety test mode

A technology for safety testing and detection system, applied in the direction of electronic circuit testing, measuring electricity, measuring devices, etc., can solve the problem that the chip can no longer enter the test mode, and achieve the effect of improving protection effectiveness, high feasibility and difficulty.

Active Publication Date: 2020-04-03
BEIJING SMARTCHIP MICROELECTRONICS TECH COMPANY +4
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In the existing technology, a certain control signal or clock or reset signal is usually placed in the dicing slot as a chip fuse (Fuse), and after the security chip test is completed, it is cut by dicing, and the chip can no longer enter the test mode.

Method used

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  • Detection system and detection method of safety test mode

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Embodiment Construction

[0018] The specific embodiments of the present invention will be described in detail below in conjunction with the drawings, but it should be understood that the protection scope of the present invention is not limited by the specific embodiments.

[0019] Unless otherwise expressly stated otherwise, throughout the specification and claims, the term "comprising" or its transformations such as "including" or "including" will be understood to include the stated elements or components, and not Other elements or other components are not excluded.

[0020] Such as Figure 1 to Figure 2 As shown, a safety test mode detection system according to a specific embodiment of the present invention is used to prevent the test circuit of the chip from entering the safety test mode again after being abolished. The safety test mode detection system includes: a sequential logic control module, a detection circuit Module, dicing slot and trigger module. The sequential logic control module is used t...

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PUM

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Abstract

The invention discloses a detecting system and a detecting method for a safety testing mode. The detecting system is used for preventing entering the safety testing mode after a chip testing circuit is abandoned. The detecting system for the safety testing mode comprises a time sequence logic control module, a detecting circuit module and a triggering module. The triggering module is used for generating a high-level or low-level triggering signal according to an on-off state. The time sequence logic control module outputs a high-level testing mode signal according to the low-level triggering signal, thereby making a chip enter the safety testing mode, or the time sequence logic control module outputs a low-level testing mode signal according to the high-level triggering signal, thereby making the detecting circuit module output a self-destroying signal for performing a self-destroying operation. Therefore the detecting system for the safety testing mode improves protecting effectiveness for chip sensitive information and accords with a majority of technological realizing requirements. The detecting system can be widely applied to various safety chips.

Description

Technical field [0001] The invention relates to the field of information security of integrated circuits, in particular to a detection system and a detection method applied to a security test mode of a security chip. Background technique [0002] There will be some manufacturing defects in the chip production process, and chip testing needs to be performed to reflect the true situation of the chip and screen out the problematic chips. Security chips also usually have test circuits to ensure that the chip products delivered to users can work correctly and reliably. Therefore, the test circuit is an indispensable part of the security chip. In order to improve the test efficiency and reduce the design complexity of the test circuit, the test circuit generally has access to all resources inside the chip, and the security level of the test mode is very high. In order to effectively resist attackers using the test mode to steal key user data inside the security chip, tamper with the c...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/282G01R31/2853
Inventor 胡晓波晁攸重王海峰邓剑伟刘亮甘杰涂因子邵瑾陈奎林赵东艳张海峰唐晓柯张茜歌
Owner BEIJING SMARTCHIP MICROELECTRONICS TECH COMPANY
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