Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Disturbance source tracing method

A technology of disturbance source and analysis method, applied in the field of disturbance source tracing, can solve the problem of high dependence on data quality, and achieve the effect of improving reliability and accuracy

Active Publication Date: 2018-04-03
IND TECH RES INST
View PDF6 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the above methods have a high dependence on data quality, and the scope of analysis is limited to disturbance phenomena caused by nonlinear actions

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Disturbance source tracing method
  • Disturbance source tracing method
  • Disturbance source tracing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] Generally speaking, when using different process analysis methods to analyze multiple candidate nodes in the system, different causal relationships between the candidate nodes will be obtained, and then different topology information will be obtained. These topology information may be included in the wrong information. vary. In the present disclosure, the topology information obtained by the analysis system of various process analysis methods is analyzed by the probability distribution algorithm, and then the multiple serialized results obtained by the analysis are fused to integrate each candidate node as a disturbance source. probability. The result of this combination of methods not only reduces the probability of error, but the calculated probability also presents possible perturbation conduction paths.

[0027] The disturbance source tracing method of the present disclosure is applicable to computing devices. The computing device is, for example, a personal compu...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention provides a disturbance source tracing method adapted for tracing a disturbance source of a system including a plurality of candidate nodes by a computing apparatus. In this method, the computing apparatus obtains a plurality of topology information by analyzing the system using a plurality of process analyzing methods respectively. The topology information records causalitiesbetween the candidate nodes of the system. The computing apparatus applies each causality of the topology information to a probability distribution algorithm, and calculates a stationary probabilitydistribution of each of the candidate nodes. The computing apparatus also synthesizes the stationary probability distributions calculated with respect to each process analyzing method to calculate a probability distribution of each of the candidate nodes being the disturbance source and find the disturbance source causing the disturbance in the system from lots of oscillation circuits.

Description

technical field [0001] The present disclosure relates to a disturbance source tracing method, and in particular, to a disturbance source tracing method combining various topological information. Background technique [0002] Generally speaking, improper adjustment of parameters of various controllers, wear of valves, external interference or other factors in the workshop may cause disturbance of the circuit in the workshop. The oscillatory disturbance is a periodic phenomenon, usually with specific amplitude and frequency characteristics. When a certain circuit in the workshop produces oscillation for some reason, through the feedback and transmission of control signals or substances between the circuits, the oscillation will spread to the surrounding related circuits and even spread to the whole factory, resulting in a shock of the whole factory. (plant wide oscillation) phenomenon. When the disturbance of the whole plant continues, it may cause the process to jump and re...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06Q10/06G06F17/50
CPCG16Z99/00F01D21/00F04B51/00H04L41/12G06F30/18
Inventor 李俊贤郑仪诚徐振凯陈俊彦
Owner IND TECH RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products