Device and method for detecting overlapping leaf area index of tea tree based on spectral reflection

A technology of leaf area index and spectral reflection, which is applied in measuring devices, optical devices, color/spectral characteristic measurement, etc., can solve problems such as the difficulty of leaf area index detection, achieve the best light-gathering and reflection effect, improve light efficiency, The effect of smooth movement

Inactive Publication Date: 2018-04-13
SOUTH CHINA AGRI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The leaves of tea trees are different from those of other fruit trees. The leaves of tea trees are relatively dense, and the leaves are basically overlapping, which brings certain difficulties to the detection of leaf area index.

Method used

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  • Device and method for detecting overlapping leaf area index of tea tree based on spectral reflection
  • Device and method for detecting overlapping leaf area index of tea tree based on spectral reflection
  • Device and method for detecting overlapping leaf area index of tea tree based on spectral reflection

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Embodiment

[0034] This embodiment discloses a tea tree overlapping leaf area index detection device based on spectral reflection, such as figure 1 and 2 As shown, it includes a direct light source 4, a photoelectric detector, a data acquisition card 2 and a host computer 1, and the photodetector includes a photoelectric reflection sensor 5 and a photoelectric signal conditioning circuit 3;

[0035] The photoelectric reflective sensor 5 is connected to the input end of the photoelectric signal conditioning circuit 3, and the output terminal of the photoelectric signal conditioning circuit is connected to the data acquisition card 2 through the data bus 8, and the data acquisition card 2 is connected to the upper computer 1;

[0036] The light outlet 4 of the direct light source is provided with a reflector 6; as figure 2As shown, the photoelectric reflection sensor 5 is arranged on the edge of the light outlet of the direct light source 4, and receives the light reflected back after the...

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PUM

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Abstract

The invention discloses a device and a method for detecting an overlapping leaf area index of a tea tree based on spectral reflection, including a direct light source, a photodetector, a data acquisition card and an upper computer. The photodetector includes a photoelectric reflection sensor and a photoelectric signal conditioning circuit; the photoelectric reflection sensor is connected to the input end of a photoelectric signal conditioning circuit, the output end of the photoelectric signal conditioning circuit is connected to the data acquisition card via a data bus, and the data acquisition card is connected to the upper computer; the light outlet of the direct light source is provided with a reflection cup; and the photoelectric reflection sensor is arranged on the edge of the lightoutlet of the direct light source for receiving light sent by the direct light source and then reflected back. The invention can simply and quickly detect the leaf area index of the tea leaves throughthe reflected light energy of the direct light source and the spot area of each test point, and has the advantages of simple structure, easy operation and real-time detection.

Description

technical field [0001] The invention relates to a method for detecting leaf area, in particular to a device and method for detecting overlapping leaf area index of tea trees based on spectral reflection. Background technique [0002] Leaf Area Index (LAI) provides structured quantitative information for the description of plant canopy surface material and energy exchange. An important parameter of function is also an important structural parameter of the ecosystem, which can be used to reflect the number of plant leaves, the change of canopy structure, the vitality of plant communities and their environmental effects. At present, the indirect optical model measurement method in the LAI detection method mainly studies the void ratio, that is, the probability that the solar radiation in the canopy is not intercepted, and a series of canopy LAI analysis instruments based on void analysis have emerged. However, due to a large number of overlapping leaves, when the leaf area ind...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/28G01N21/27
CPCG01B11/285G01N21/27
Inventor 吴伟斌洪添胜宋淑然李震陈建国赵新王玉兴宋倩张震邦杨晓彬陈理付正德李泽艺黄家曦
Owner SOUTH CHINA AGRI UNIV
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