Transparent material defect detection system and method

A transparent material, defect detection technology, applied in the direction of analyzing materials, material analysis by optical means, measuring devices, etc., can solve problems such as inability to meet the needs of high-precision defect detection, limited image data, etc., to facilitate the analysis of defect types, The effect of enriching the amount of information, improving the accuracy and precision

Pending Publication Date: 2018-04-24
湖南科创信息技术股份有限公司
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Problems solved by technology

[0005] The invention provides a transparent material defect detection system and method to solve the technical problems that the image data coll

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  • Transparent material defect detection system and method
  • Transparent material defect detection system and method

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Embodiment Construction

[0050] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0051] A preferred embodiment of the present invention provides a transparent material defect detection system. The transparent material defect detection system in this embodiment includes:

[0052] At least one detection unit, which includes an imaging device and a combined light source, wherein the imaging device is used for imaging and scanning the transparent material; the combined light source is used to provide multiple lighting modes for defect detection of the transparent material;

[0053] At least one mirror imaging component is used to cooperate with at least one detection unit to assist at least one imaging device to perform imaging scanning of transparent materials in a joint imagi...

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Abstract

The invention discloses a transparent material defect detection system and method. The system includes: at least one detection unit, including an imaging device and a combination light source, the imaging device is used for imaging and scanning the transparent material; the combination light source is used for providing various lighting mode; at least one mirror imaging component is used for virtual imaging of transparent material defects; the transmission device is used for causing relative movement between the transparent material and the detection unit; the controller is used for controlling the time-sharing switching of various lighting modes and Image acquisition by the imaging device; the processor is communicatively connected with the controller and at least one imaging device. It realizes the multi-channel image acquisition of transparent material defects. Compared with the existing defect detection system, it greatly enriches the amount of image acquisition information, improves the accuracy and precision of defect information, and improves the detection of transparent material defects. The detection rate and recognition rate are convenient for the subsequent analysis of the specific three-dimensional position of product defects and the analysis of product defect types.

Description

technical field [0001] The invention relates to the field of transparent material detection, in particular to a transparent material defect detection system and method. Background technique [0002] In the production process of transparent materials (such as flat glass, inorganic glass, organic glass, acrylic, etc.), quality control is an important link. At present, many production processes do not have automated testing equipment and rely on manual testing to control quality. However, the method of manual detection of defects has the following problems: such as missed detection, false detection, etc., the quality control standards for glass output are inconsistent, and there are many subjective factors; the required quality data cannot be obtained in real time, and it is not convenient for the statistics and query of quality data; The efficiency is low, the degree of automation is low, and the cost is high. [0003] There are also some automatic detection equipment for tr...

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Application Information

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IPC IPC(8): G01N21/958
CPCG01N21/8806G01N21/958
Inventor 刘应龙吴旭张玄樊江宁彭瑜王高娟马中峰
Owner 湖南科创信息技术股份有限公司
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