Transparent material defect detection system and method
A transparent material, defect detection technology, applied in the direction of analyzing materials, material analysis by optical means, measuring devices, etc., can solve problems such as inability to meet the needs of high-precision defect detection, limited image data, etc., to facilitate the analysis of defect types, The effect of enriching the amount of information, improving the accuracy and precision
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[0050] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.
[0051] A preferred embodiment of the present invention provides a transparent material defect detection system. The transparent material defect detection system in this embodiment includes:
[0052] At least one detection unit, which includes an imaging device and a combined light source, wherein the imaging device is used for imaging and scanning the transparent material; the combined light source is used to provide multiple lighting modes for defect detection of the transparent material;
[0053] At least one mirror imaging component is used to cooperate with at least one detection unit to assist at least one imaging device to perform imaging scanning of transparent materials in a joint imagi...
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