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Software Defect Prediction Method Based on Neighborhood Embedding Protection Algorithm Support Vector Machine

A technology of software defect prediction and support vector machine, which is applied in computer components, software testing/debugging, computing, etc., and can solve problems such as software measurement data redundancy

Active Publication Date: 2020-10-20
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Application Information

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Problems solved by technology

[0012] The present invention proposes a software defect prediction method based on the support vector machine based on the neighborhood embedding protection algorithm, which is used to solve the problem of software measurement data redundancy, so that the final defect distribution prediction result has a higher accuracy than other traditional prediction technologies Accuracy

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  • Software Defect Prediction Method Based on Neighborhood Embedding Protection Algorithm Support Vector Machine
  • Software Defect Prediction Method Based on Neighborhood Embedding Protection Algorithm Support Vector Machine
  • Software Defect Prediction Method Based on Neighborhood Embedding Protection Algorithm Support Vector Machine

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Embodiment Construction

[0022] A kind of software defect prediction method based on neighborhood embedding protection algorithm support vector machine of the present invention, specific embodiment comprises the following steps:

[0023] (1) Obtain the prediction data set:

[0024] The experimental data used in this embodiment comes from the MDP provided by NASA, which is widely used in software defect prediction research. It contains 13 datasets, as shown in Table 1. Each data set contains multiple samples, each sample corresponds to a software module, and each software module consists of several static code attributes, and identifies the number of attributes in the software module. Static code attributes identify each piece of data, including code lines (Loc), Halstead attributes and McCabe attributes. In this embodiment, CM1, KC3, MW1 and PC1 in NASA are selected as prediction data sets.

[0025] Table 1: 13 data sets provided by NASA

[0026]

[0027] (2) Select the training set X from the ...

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Abstract

The invention proposes a software defect prediction method based on a neighborhood embedding protection algorithm support vector machine, which is used to solve the problem of software measurement data redundancy. Including: select training set X from software defect prediction data set 1 and the test set X 2 ; Using the NPE algorithm for the training set X 1 and the test set X 2 Carry out dimensionality reduction; the training set Y after dimensionality reduction 1 As the training input set, use the support vector machine SVM for training to obtain the trained defect prediction model; the dimensionality-reduced test set Y 2 As a test input set, use the trained defect prediction model to make predictions, and compare the prediction results with the actual results. If the prediction results meet the termination conditions, the software defect prediction model at this time is the optimal software defect prediction model; otherwise, restart Perform SVM training for optimization.

Description

technical field [0001] The invention relates to a software defect prediction method based on a neighborhood embedding protection algorithm support vector machine, belonging to the technical field of software prediction. Background technique [0002] Software defects: IEEE729-1983 has a standard definition of defects. From the internal point of view of the product, defects are various problems such as errors and defects in the process of software product development or maintenance; from the external point of view of the product, defects are the software system and its original The failure or violation of a certain function that needs to be realized. [0003] Static prediction: Static software defect prediction technology is an earlier prediction technology that is currently researched and applied most. It is mainly based on extracting software-related measurement information to establish a corresponding prediction model for defect prediction. [0004] Prediction model based ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36G06K9/62
CPCG06F11/3604G06F18/21322G06F18/2411
Inventor 单纯胡昌振熊雯洁位华雷敏
Owner BEIJING INSTITUTE OF TECHNOLOGYGY