Laser particle analyzer centering and adjusting method and mechanism

A technology of laser particle size analyzer and centering adjustment, which is applied in particle size analysis, instruments, scientific instruments, etc., and can solve cumbersome problems

Active Publication Date: 2018-05-04
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
View PDF4 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

It is characterized by fast test speed, wide test range, good repeatability and authenticity, and easy operation. However, since the laser particle size analyzer mainly measures the angle and intensity of particle scattered light, for this reason, all components in the instrument are required. The optical axis must be consistent with the main optical axis. It is a relatively cumbersome operation for the mechanical alignment of the laser particle size analyzer.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Laser particle analyzer centering and adjusting method and mechanism
  • Laser particle analyzer centering and adjusting method and mechanism
  • Laser particle analyzer centering and adjusting method and mechanism

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0029] The terms "first", "second", "third", "fourth", etc. (if any) in the description and claims of the present invention and the above drawings are used to distinguish similar objects, and not necessarily Used to describe a specific sequence or sequence. It is to be understood that the terms so used are interchangeable under app...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a laser particle analyzer centering and adjusting mechanism which comprises a laser, a collimation and beam expanding system, a sample circulation system, a Fourier transform lens and a scattering detector, wherein the laser is used for emitting laser beams; the collimation and beam expanding system is used for collimating the laser beams; the sample circulation system is used for bearing test samples; a hollow through hole is formed in a position, which corresponds to the position of a focus point of the Fourier transform lens, on the scattering detector; a single-pointdetector is arranged on one side, which deviates from the Fourier transform lens, of the scattering detector; the laser beams emitted by the laser pass through the collimation and beam expanding system and become parallel beams, and the parallel beams pass through the sample circulation system and the Fourier transform lens to be focused on a plane on which the scattering detector is located; when the test sample does not exist, the position of the scattering detector is adjusted, so that the parallel beams are focused by the Fourier transform lens and then pass through the hollow through hole; and the position of the single-point detector is adjusted, so that an output signal is maximum. The light path is aligned by utilizing the hollow through hole on the scattering detector and the single-point detector, so that the whole mechanism is centered. The invention further provides a laser particle analyzer centering and adjusting method.

Description

technical field [0001] The invention relates to the technical field of instruments and meters, in particular to a centering adjustment method and mechanism of a laser particle size analyzer. Background technique [0002] Laser particle size analyzer is an instrument that analyzes particle size through particle diffraction or spatial distribution of scattered light (scattering spectrum). The laser particle size analyzer measures the particle size distribution based on the physical phenomenon that the particles can scatter the laser light. Its specific working principle is as follows: Since the laser has good monochromaticity and strong directionality, a beam of parallel laser light will irradiate to an infinite distance in an infinite space without hindrance, and it will be very fast during the propagation process. There is little divergence. [0003] When the light beam is blocked by particles, part of the light will be scattered. The propagation direction of the scattere...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/02G01N21/47G01N21/01
CPCG01N15/0211G01N21/01G01N21/47G01N2015/0238
Inventor 党博石刘英
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products