The invention discloses an
integrated circuit internal
short circuit failure lossless positioning method based on
liquid crystal phase change. The method comprises the following steps of spraying a
liquid crystal solution film on the surface of an
integrated circuit chip, adding a polarized light lens at a light outlet of a
microscope light source, adding a rotatable polarized light lens at an incident port of an objective lens, adjusting the angle of the objective lens polarized light lens, and conducting fixation when darkest light is observed from the
eyepiece, attaching a heating plate tothe upper surface of the
microscope objective table, placing the
integrated circuit chip on the heating plate on the surface of the
microscope objective table, placing the
microscope objective table under the
irradiation of a microscope polarized
light source, and adjusting the microscope to enable a clear image of the integrated circuit
chip to be presented in the
eyepiece, providing
electric signal excitation for the integrated circuit chip, so that an
electric signal flows through an observation area, and gradually increasing the intensity of an electric
excitation signal, observing the condition of a darkening area on the surface of the chip through the
eyepiece, and taking an abnormal darkening area as an electric leakage area. Lossless positioning of internal
short circuit failure ofthe integrated circuit chip is achieved, and the method has the advantages of being easy and convenient to operate and low in cost.