3 results about "Microscope light source" patented technology

This invention discloses an illumination device for solving the concave liquid surface effect in well plate imaging, belonging to the field of microscope light source technology. The device includes an inverted microscope illumination source and several annular light sources distributed in a dome-like pattern around it. The inverted microscope illumination source is composed of a central light source, a collimating lens, and a condenser lens in sequence. The annular light sources contain multiple LED beads, and the size of the rings matches the diameter of the microwells in a common cell culture plate, with adjustable angles. Through the synergistic effect of traditional vertical illumination and dome-shaped oblique illumination, this invention effectively improves the imaging quality of well plates, adapts to microwell plates of different diameters, is easy to operate, and highly practical, providing strong support for cell observation and other related work.

The application discloses a physical-based Fourier ptychographic light source pose correction method. The low-resolution image obtained through the Fourier ptychographic light path is affected by the pose deviation of the LED lamp plate in the system, thereby affecting the reconstruction quality. The application firstly constructs a physical model of the bright field to dark field boundary of the captured image for the microscope used, collects a group of low-resolution images of empty slides, screens out transition images with bright-dark boundaries, and calculates the bright-dark field boundary information of the transition images and the unbiased transition images generated by the model to solve the full pose parameters (including the distance from the sample, two orthogonal lateral displacements, the in-plane rotation angle and two tilt angles) of the misaligned LED array. The illumination angle can be accurately corrected, thereby ensuring the accuracy and uniformity of the illumination effect. It is verified through experiments that the application achieves good correction effect in practical application and enhances the robustness of the Fourier ptychographic reconstruction system to the light source position deviation.

A microscope includes a light source positioned at a light source plane of the microscope, a pattern projection component positioned at a light stop plane of the microscope, and an optical sensor positioned at an image plane of the microscope. The light source is configured to transmit light to an object plane of the microscope via the pattern projection component. The pattern projection component is configured to, when the light interacts with the pattern projection component, cause the light to carry a pattern. The pattern, when the light transmits from the pattern projection component to an object positioned at the object plane, is projected on a region of the object.