A closed-loop test method for virtual terminals in smart substations
A smart substation and closed-loop test technology, applied in the field of smart substations, can solve problems such as error-prone and low test efficiency, and achieve the effect of ensuring correctness, eliminating potential security threats, and beneficial test mode
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[0043] Below in conjunction with specific embodiments and appendices Figure 1-8The present invention is described in detail:
[0044] 1. Visualization of virtual terminal input information
[0045] 1.1 Extract virtual terminal input information
[0046] 1.1.1 The test software imports the SCD file containing the configuration information of the IED device to be tested, and retrieves the IED instantiation part of the device to be tested in the SCD file element (may contain multiple elements), to obtain the list of input virtual terminals of the device under test.
[0047] 1.1.2 In the above list of input virtual terminals, the iedName, ldInst, prefix, lnClass, lnInst, doName, daName attributes of each input virtual terminal can be obtained.
[0048] 1.1.3 In the above input virtual terminal list, the intAddr attribute of each input virtual terminal can be obtained. According to the intAddr attribute, you can find the internal description information of the correspondin...
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