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A closed-loop test method for virtual terminals in smart substations

A smart substation and closed-loop test technology, applied in the field of smart substations, can solve problems such as error-prone and low test efficiency, and achieve the effect of ensuring correctness, eliminating potential security threats, and beneficial test mode

Active Publication Date: 2020-01-14
西电通用电气自动化有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The obvious disadvantages of this method are: the first test efficiency is extremely low; the second test process is not closed-loop, and it is necessary to manually read the real-time status or data of the device from the device panel in the middle; Judging the results is sometimes error-prone

Method used

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  • A closed-loop test method for virtual terminals in smart substations
  • A closed-loop test method for virtual terminals in smart substations
  • A closed-loop test method for virtual terminals in smart substations

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Embodiment Construction

[0043] Below in conjunction with specific embodiments and appendices Figure 1-8The present invention is described in detail:

[0044] 1. Visualization of virtual terminal input information

[0045] 1.1 Extract virtual terminal input information

[0046] 1.1.1 The test software imports the SCD file containing the configuration information of the IED device to be tested, and retrieves the IED instantiation part of the device to be tested in the SCD file element (may contain multiple elements), to obtain the list of input virtual terminals of the device under test.

[0047] 1.1.2 In the above list of input virtual terminals, the iedName, ldInst, prefix, lnClass, lnInst, doName, daName attributes of each input virtual terminal can be obtained.

[0048] 1.1.3 In the above input virtual terminal list, the intAddr attribute of each input virtual terminal can be obtained. According to the intAddr attribute, you can find the internal description information of the correspondin...

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Abstract

The invention provides a closed-loop test method for a virtual terminal in an intelligent substation. By introducing an SCD file, the input configuration of a GOOSE virtual terminal of a protection / monitoring device is completed and outputting is conducted; meanwhile, by means of an MMS message triggered by change of input data of the virtual terminal of the protection / monitoring device, station-control-layer MMS information corresponding to the GOOSE virtual terminal is obtained, and a closed-loop test is formed. The method can effectively verify the consistency of a static model and a dynamic model of the protection / monitoring device, and can serve as an effective means for judgment of the consistency of the configuration of the SCD file of the device and a running configuration. Potential threats that safe substation operation is likely to be affected by inconsistency of the configuration of the SCD file of an IED device of the intelligent substation and the running configurationare avoided.

Description

technical field [0001] The invention belongs to the technical field of intelligent substations, and relates to a closed-loop testing method for virtual terminals of intelligent substations. Background technique [0002] One of the most significant differences between smart substations and traditional substations is the digitization of secondary system signals, that is, the transmission of signals between secondary devices is not the traditional analog voltage, analog current, switch contact signals, but the SV based on the IEC61850 standard. Message signal, GOOSE message signal. The message signal is transmitted through the optical fiber based on the network transmission mechanism. Therefore, the analog voltage, analog current, and switch contact signals that can be measured by ordinary multimeters are not so intuitive in an instant. This brings great challenges to the judgment of the presence and authenticity of secondary signals in smart substations. [0003] At present,...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 吴恒福柳明陈良钰申剑惠洒乐纪攀巩芫芳
Owner 西电通用电气自动化有限公司
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