Device for microscopic tracking of three-dimensional displacement of particles

Abstract

The invention discloses a device for the microscopic tracking of the three-dimensional displacement of particles. In the technical scheme of the invention, two LED light beams which are arranged symmetrically passes through a sample pool to enter a microscope objective entrance pupil after passing through a collimation focusing unit, and the light from a microscope objective is inputted into a light splitting unit through a reflection unit. After being gathered by a first lens in the light splitting unit, the two LED light beams are split by two wedge lenses, and are imaged in the same image controller through a second lens in the light splitting unit. Therefore, the image controller obtains a double-LED light projection of a target particle in the sample pool, and obtains the three-dimensional displacement information of the target particle through image processing. From the collimation focusing unit to the image controller, all units are located and linked through taking the opticalaxis of the microscope objective and the optical axis of the light splitting unit. The whole device is shaped like L, is simple in optical path, is compact in structure, is small in size, and is accurate in measurement.

Description

Technical field [0001] The invention relates to the technical field of particle detection and measurement devices, and more specifically, to a device for microscopically tracking the three-dimensional displacement of particles. Background technique [0002] The detection of the displacement of solid and liquid particles, especially small particles, plays an important role in many fields. At present, there are many different methods for detecting the displacement of particles. Among them, the optical method is widely used, and the displacement of the particles is measured by a device composed of a variety of different optical elements. [0003] Existing devices for measuring particle displacement generally have problems such as complex measurement optical path, long optical path, large optical device and adjustment frame, large space occupied by the entire device, and low measurement accuracy. Therefore, how to provide a device with simple light path, compact structure, small volum...

AI Technical Summary

Problems solved by technology

[0003] Existing devices for measuring particle displacement generally have problems such as complex measurement optical path, long optical path, large volume of optical devices and adjustment frames, large space occupied by the entire device, and low measurement accuracy.

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