Sequential slice oriented real-time registration device and method for scanning electron microscope image

A scanning electron microscope and image technology, applied in image enhancement, image analysis, image data processing, etc., can solve the problems of lack of solutions, inability to quickly and stably obtain high-resolution 3D electron microscope image library of nerve tissue, and achieve serious lag, The effect of meeting the needs of real-time registration

Active Publication Date: 2018-05-15
中科观微北京科技有限公司
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Problems solved by technology

The inability to quickly and stably obtain the high-resolution 3D electron microscope image library of neural tissue has become one of the bottlenecks l

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  • Sequential slice oriented real-time registration device and method for scanning electron microscope image
  • Sequential slice oriented real-time registration device and method for scanning electron microscope image
  • Sequential slice oriented real-time registration device and method for scanning electron microscope image

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[0058] Preferred embodiments of the present invention are described below with reference to the accompanying drawings. Those skilled in the art should understand that these embodiments are only used to explain the technical principle of the present invention, and are not intended to limit the protection scope of the present invention.

[0059] The real-time registration device for SEM images oriented to serial slices proposed by the present invention, such as figure 1 As shown, the key is to start with the hardware acceleration link, implement each link of the sequence slice registration algorithm on different hardware platforms, build a heterogeneous computing real-time registration system based on FPGA+CPU / GPU, and apply sequence slice image registration Algorithm to realize real-time registration while collecting electron microscope. The scanning electron microscope first images the serial slices. During the slice imaging process, the electron microscope sends the image da...

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Abstract

The invention relates to the field of scanning electron microscope image registration, particularly relates to a sequential slice oriented real-time registration device and method for a scanning electron microscope image, and aims to improve the instantaneity of the electron microscope image registration. The real-time registration device comprises an FPGA (Field Programmable Gate Array) and a calculation server, wherein the calculation server comprises a CPU (Central Processing Unit) and a GPU (Graphics Processing Unit); the FPGA is used for directly connecting with an electron microscope toobtain sequential slice image data in real time, calculating a corresponding point between adjacent slice images and finally sending the image data obtained from the electron microscope and the information of the corresponding point between adjacent slices to the calculation server; the CPU in the calculation server regulates and optimizes a corresponding point position obtained by matching in thesequential slice; and the GPU in the calculation server carries out image deformation according to the regulated corresponding point position. By use of the device, a high-accuracy low-time-delay long-sequence registration ability for the high-flux image data of an electron microscope system can be formed, and the real-time registration requirement of high-flux electron microscope sequential slice imaging is met.

Description

technical field [0001] The invention relates to the field of scanning electron microscope image registration, in particular to a serial slice-oriented scanning electron microscope image real-time registration device and method. Background technique [0002] Brain connection map research understands the working principle of the brain by constructing the structure of the nervous system from the macroscopic, mesoscopic and microscopic scales, and consistent with physiological functions. The microscopic connection map is dedicated to obtaining the connections of fine structures such as neurons and synapses network. The clear imaging of synaptic structure must rely on the observation means of nanoscale-electron microscope, so as to trace the weakest (20-30 nanometer) neurite connection lines in the dense nerve fiber network. [0003] The neural structural connection network at the microscopic scale is generally obtained by three-dimensional reconstruction of scanning electron mi...

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Application Information

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IPC IPC(8): G06T7/33G06F9/38
CPCG06F9/3822G06T7/33G06T2207/30016
Inventor 陈曦韩华李国庆谢启伟沈丽君
Owner 中科观微北京科技有限公司
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