An imaging correction method and device based on weak information preservation

A correction method and imaging technology, applied in measuring devices, optical testing flaws/defects, instruments, etc., can solve problems such as uneven imaging, achieve weak information retention, ensure robustness and reliability, and solve imaging unevenness problem effect

Active Publication Date: 2020-09-11
WUHAN JINGCE ELECTRONICS GRP CO LTD
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Problems solved by technology

[0006] In view of the above defects or improvement needs of the prior art, the present invention provides an imaging correction method and device based on weak information retention, the purpose of which is to solve the problem of uneven imaging caused by the limitation of the imaging system, so as to ensure the accuracy of macroscopic defects of the display panel. Detection, while retaining the weak information of the imaging system, does not interfere with the detection of microscopic defects on the display panel, ensuring the reliability and accuracy of detection

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  • An imaging correction method and device based on weak information preservation
  • An imaging correction method and device based on weak information preservation
  • An imaging correction method and device based on weak information preservation

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[0038] In order to make the objectives, technical solutions and advantages of the present invention clearer, the following further describes the present invention in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0039] The production process of LCD and OLED display panels is complex, and the types of production defects are diverse; for example, LCD defects include many types listed in Table 1 below, and the causes and manifestations of each type of defect are different; according to the size of the defect Divided into macro defects and micro defects.

[0040] Table 1 LCD defect classification

[0041]

[0042] I...

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Abstract

The invention discloses a weak information retention-based imaging correction method and a weak information retention-based imaging correction device. According to the method, in a response curve local interval, the relation between a response gray value of a pixel and incident light intensity is subjected to approximately linearized treatment, and the response straight lines of all the pixel points are the same by changing the slope and the deviation of each pixel response straight line; for the influence by dust and noise in a camera lens, the bright field image weak characteristics are extracted by using a Marr-Hildreth operator, and the camera noise is judged through 4 to 8 neighborhoods and is retained; the device comprises an image acquisition unit, an image calculation unit and an acquisition management unit; the acquisition management unit is used for setting an imaging coefficient range, setting an ROI area for calibrating a calculation average value and managing image acquisition correction coefficient; the image acquisition unit is used for performing image acquisition; and the image calculation unit is used for calculating the correction coefficient of each pixel according to the acquired image and optimizing an acquisition coefficient matrix according to the coefficient distribution range.

Description

Technical field [0001] The invention belongs to the technical field of automatic detection of display panel defects, and particularly relates to an imaging correction method and device based on weak information retention. Background technique [0002] The production process of LCD, OLED and other display panels is relatively complex, and there are various types of production defects, such as large defect areas such as color difference, uneven brightness, and Mura defects; such as fine microscopic display defects such as bright spots, dark spots, bright lines, and dark lines Wait. The non-uniformity of the imaging used to detect the display panel may lead to inaccurate defect detection. Therefore, the imaging used for detection must be corrected, and the correction cannot interfere with the detection of fine microscopic displays. The causes of imaging unevenness include: inconsistent response between the center of the lens and the edge of the lens, stains on the lens gray layer, ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/88G01N21/93G01N21/95G02F1/13
CPCG01N21/8806G01N21/8851G01N21/93G01N21/95G01N2021/8825G01N2021/8887G01N2021/9511G01N2021/9513G02F1/1309
Inventor 罗巍巍张胜森邓标华
Owner WUHAN JINGCE ELECTRONICS GRP CO LTD
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