Rapid reconstruction method of deformed antenna subreflector shape based on subreflector structure strain

Abstract

The invention discloses a rapid reconstruction method of a deformed antenna subreflector shape based on subreflector structure strain. The method comprises the following steps of determining the parameters of a main reflector, a subreflector and a back structure as well as operating frequency and material properties of a double-reflector antenna, and the distributional position and number of strain sensors; extracting the measured value of the strain sensors and setting up the finite element model of the antenna; determining a node at an antenna subreflector target point and a modal shape matrix corresponding to the node; determining a node at the strain sensor on the antenna subreflector and a strain modal shape matrix corresponding to the node; calculating the broad sense modal coordinate of the double-reflecting plane antenna; calculating the nodal displacement of an antenna subreflector target point; calculating the position of the antenna subreflector target point subjected to deformation according to the nodal displacement of the antenna subreflector target point and combined with the ideal position of the target pint, so as to rapidly reconstruct the subreflector shape of adeformed antenna. The method can be used for rapidly and effectively reconstructing the subreflector shape of the deformed antenna, and the double-reflecting plane antenna is conducive to meeting theindex requirement on electrical properties.

Description

Technical field [0001] The invention belongs to the field of antenna technology, and specifically relates to a method for rapidly reconstructing the topography of a deformed antenna secondary surface based on the structural strain of the secondary surface. The invention can be used to quickly and effectively calculate the displacement of the target point on the secondary surface of the antenna under the condition that the secondary surface of the dual reflector antenna is strained, and then reconstruct the deformed secondary surface appearance, which is beneficial for the dual reflector antenna to meet electrical performance Requirement of the index to make the antenna work performance optimal. Background technique [0002] As large antennas are increasingly widely used in astronomical observations, satellite tracking and communications, the aperture and frequency bands of dual reflector antennas are also increasing, which brings many challenges to the structure design of the ant...

AI Technical Summary

Problems solved by technology

[0006] In order to solve the above-mentioned defects existing in the prior art, the object of the present invention is to provide a method for quickly reconstructing the sub-surface morphology of deformed antennas based on the structural strain of the sub-surface. Effectively calculate the displacement of the target point on the secondary surface of the antenna, and then quickly reconstruct the shape of the secondary surface after deformation, which is conducive to the dual-reflector antenna meeting the electrical performance index requirements and making the antenna work optimally

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