Device and method for detecting position state of wafer in chip box based on PLC control
A technology of state detection device and wafer box, which is applied in the direction of program control, program control, electrical program control, etc. Process stable and reliable effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0035] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0036] Such as figure 1 Shown is the control structure diagram of the present invention.
[0037] A PLC controller executes the program and detects various sensors of the cassette and the wafer. The pulse output interface of the PLC is connected to the servo driver; the encoder pulse output interface of the servo motor is connected to the PLC through the level conversion module.
[0038] The PLC communicates with the upper computer; the detection sensor includes: a laser sensor, a cassette detection sensor, a wafer slip-out sensor, a zero position sensor, a positive limit sensor, and a negative limit sensor. The laser sensor is used to detect the position of the wafer; the cassette detection sensor is used to detect the presence or absence of the cassette; the wafer slide out sensor is used to detect whether the wafer has slipped out of the c...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More - R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com



