Test method, apparatus, system, storage medium and processor for equipment
A test method and storage medium technology, applied in the test field, can solve the problems of low test efficiency and achieve the effect of improving test efficiency
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0032] The embodiment of the present invention provides a test system for a device.
[0033] figure 1 It is a schematic diagram of a test system of an apparatus according to an embodiment of the present invention. Such as figure 1 As shown, the system includes: signal generating device 10 and processing device 20.
[0034] The signal generating device 10 is configured to input an analog opening signal to the target device.
[0035] The test system of the apparatus of this embodiment includes a signal generating device 10, such as a switching signal generating device, can simulate a high frequency opening signal, and can input it to the target device before the target device is transported or the target device is maintained. signal. The target device is a measurement device, which can be a substation integrated automation device, such as an automation device such as a smart substation intelligent terminal, a measurement and control device.
[0036] The processing apparatus 20 is...
Embodiment 2
[0057] The embodiment of the present invention also provides a test method of a device. It should be noted that the test method of the apparatus of this embodiment can be performed by the test system of the apparatus of the embodiment of the present invention.
[0058] figure 2 It is a flow chart of a test method of a device according to an embodiment of the present invention. Such as figure 2 As shown, the method includes the following steps:
[0059] Step S202, enter the analog opening signal to the target device.
[0060] In the technical solution provided in the present step S202, analog open signal is input to the target device.
[0061] The target device of this embodiment is a device under test, and may be a substation integrated automation device. For example, an automation device such as a smart substation intelligent terminal, a measuring device, and an analog opening signal input to the target device, for example, input to the target device input simulation Frequency...
Embodiment 3
[0085] The technical solutions of the present invention will be exemplified in conjunction with preferred embodiments.
[0086] In the substation, the automation equipment mainly implements the monitoring and control functions of a device, one of which is the state of the device (for example, the circuit breaker is separated, the tool gate is separated, the remote / local signal, the function is stroke, etc.) And the alarm signal (such as the circuit breaker SF6 pressure low alarm, power supply disappearance, etc.) is transmitted to the opening terminal of the signal acquisition device (such as the intelligent terminal, measure control device and other automation equipment) by active contact / passive contacts. Identify and process the signals, translate into network packets to the local monitoring and control center automation master system. In actual operation, the amount of semaphys generated by the device can cause insufficient processing capacity of the signal due to automati...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More