Transmission electron microscope in-situ sample holder head and sample holder comprising holder head

Abstract

The invention discloses a transmission electron microscope in-situ sample holder head. The transmission electron microscope in-situ sample holder head comprises a sample holder head body, the front end of the sample holder head body is provided with a through hole, a ceramic heating ring, a sample holder and a sample pressure plate laminated in sequence are arranged in the through hole along the axis direction, the axes of the ceramic heating ring, the sample holder and the sample pressure plate and the axis of the through hole are superposed, the sample pressure plate is arranged in a step hole arranged at the center of the sample holder and used for placing a sample, gaps are arranged between the sample holder and the inner side of the through hole and between the ceramic heating ring and the inner side of the through hole, side surfaces of the sample holder are provided with fixing lugs capable of being fixed to the sample holder head body, and one end of the through hole is provided with support blocks protruding towards the axis. According to the structure of the ceramic heating ring, in-situ ceramic heating is realized, the heating process is simplified, the gaps are arrangedbetween the sample holder head body and the internal structures thereof, the sample holder is fixed through the fixing lugs, and the ceramic heating ring is supported by the support blocks so that the contact area between the sample holder and the ceramic heating ring and the sample holder head body can be reduced, heat transfer is reduced, and the sample can obtain sufficient and uniform heat tocomplete heating.

Description

technical field [0001] The invention relates to a sample rod head of a transmission electron microscope, in particular to an in-situ heating sample rod head and a sample rod with the rod head. Background technique [0002] Transmission electron microscopy is a very powerful tool for studying the microscopic state of materials. It can directly observe the structure and morphology of materials at the sub-nanometer scale or even the sub-angstrom scale close to the theoretical limit. Analytical combinations such as loss spectroscopy can effectively identify the microstructure and chemical form of materials. Its working principle is to project the high-voltage accelerated and concentrated electron beam onto a very thin sample, and the electrons interact with the atoms inside the sample, thereby changing their direction of motion and producing solid angle scattering. The size of the scattering angle is related to the density and thickness of the sample. Therefore, images with dif...

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Problems solved by technology

[0008] The technical problem to be solved by the present invention is that the crucible-type in-situ heating sample rod has a large calorific value, needs circulating water cooling, large sample vibration, and large thermal drift, and the in-situ sample rod using a heating chip is difficult to prepare samples, and the cost of experiments is high. high problem

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