Data compression technology-based time sequence signal storage testing device and method

A time series and data compression technology, applied in information storage, digital memory information, static memory, etc., can solve the problems of misjudgment of test results, loss of valid data, etc., and achieve the effect of ultra-low power consumption

Pending Publication Date: 2018-06-22
GENERAL ENG RES INST CHINA ACAD OF ENG PHYSICS
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, NAND FLASH memory will randomly appear bad blocks. If the storage block storing valid data segments stored in the memory is damaged when reading data, part of the valid data will be lost, causing misjudgment of the test results.

Method used

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  • Data compression technology-based time sequence signal storage testing device and method
  • Data compression technology-based time sequence signal storage testing device and method
  • Data compression technology-based time sequence signal storage testing device and method

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Embodiment Construction

[0033] The principles and features of the present invention are described below in conjunction with the accompanying drawings, and the examples given are only used to explain the present invention, and are not intended to limit the scope of the present invention.

[0034] Aiming at the deficiencies of existing testing devices, a data compression algorithm for time series signals is proposed, and a time series signal storage test device is designed based on this algorithm. Due to the data compression algorithm, the device uses ferroelectric memory as the storage medium to meet the storage capacity requirements. The ferroelectric memory has the characteristics of high-speed reading and writing, ultra-low power consumption and unlimited writing, and will not produce The block can effectively improve the reliability of the storage test device and reduce the power consumption of the device.

[0035] Such as figure 1 As shown, the present invention discloses a time series signal st...

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Abstract

The invention belongs to the technical fields of embedded storage testing and data compression and particularly discloses a data compression technology-based time sequence signal storage testing device and a data compression technology-based time sequence signal storage testing method. The device can record a series of time action signals generated by an electronics system accurately and effectively; a data compression storage algorithm is provided and data storage is conducted by the algorithm, so that the expenditure of the device on the capacity of a storer can be greatly reduced; and the device has the advantages of high measuring precision, small volume, low power consumption, portability, long storage time and the like.

Description

technical field [0001] The invention belongs to the technical field of embedded storage testing and data compression, and specifically discloses a time series signal storage testing device and method based on data compression technology. Background technique [0002] During the process from launch to target impact, the missile control system usually needs to send out a series of actuation signals to realize relevant actions, such as: engine ignition signal, explosion bolt detonation signal, timing control signal, counter cycle signal, etc. In order to check whether the missile-borne control system gives the corresponding signal at the specified time point, the missile-borne time series signal storage test device is usually used to record the level characteristics of these time-activated signals. The data can be used as the basis for evaluating whether the load control is working properly. [0003] The existing missile-borne time series signal storage test device usually sam...

Claims

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Application Information

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IPC IPC(8): G11C11/22G11C29/40
CPCG11C11/2273G11C11/2275G11C11/2293G11C29/40Y02D10/00
Inventor 周继昆张荣邓婷
Owner GENERAL ENG RES INST CHINA ACAD OF ENG PHYSICS
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