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A device for realizing multi-point real-time measurement of wall liquid film thickness

A liquid film thickness, real-time measurement technology, applied in the direction of electromagnetic measuring device, electric/magnetic thickness measurement, etc., can solve the problem that the multi-point continuous measurement of liquid film thickness cannot be realized, so as to ensure multi-point synchronous measurement, improve economy, The effect of facilitating data processing

Active Publication Date: 2020-01-31
HARBIN ENG UNIV
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Problems solved by technology

[0006] The purpose of the present invention is to provide a device for realizing the multi-point real-time measurement of the thickness of the wall surface liquid film, a kind of conductance measurement device for the multi-point real-time measurement of the liquid film thickness without destroying the wall surface, and solve the problem on the basis of not transforming the wall surface. Solve the problem that the existing measurement system cannot realize the multi-point continuous measurement of the liquid film thickness

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  • A device for realizing multi-point real-time measurement of wall liquid film thickness
  • A device for realizing multi-point real-time measurement of wall liquid film thickness
  • A device for realizing multi-point real-time measurement of wall liquid film thickness

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Embodiment Construction

[0021] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0022] The invention provides a device for multi-point real-time measurement of liquid film thickness. The measuring device is composed of a conductance sensor part, a conductance sensor switching circuit, and a signal processing circuit; the conductance sensor part is mainly composed of electrodes, terminals, flexible circuit boards, and wires. Realize the function of acquiring and transmitting the liquid film thickness signal without damaging the wall surface; the sensor switching circuit can be divided into two parts: the sensor switching signal generation circuit and the sensor switching circuit, mainly composed of Schmitt trigger, JK trigger, Composed of decoder, virtual switch, filter circuit, amplifier circuit, adding circuit, and terminal blocks, it realizes the switching function of the conductance sensor; the signal processin...

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Abstract

The invention provides a device for achieving wall surface liquid film thickness multi-point real-time measurement. The device is composed of an electric conduction sensor part, an electric conductionsensor switching circuit and a signal processing circuit; the electric conduction sensor part is mainly composed of an electrode, a wiring terminal, a flexible circuit board, and a lead wire. The function of acquiring and transmitting the liquid film thickness signal under the condition that the wall surface is not damaged is achieved; the sensor switching circuit part can be divided into two parts, namely a sensor switching signal generation circuit and a sensor switching switch circuit, and is mainly composed of a Schmidt trigger, a JK trigger, a decoder, a virtual switch, a filtering circuit, an amplifying circuit, an addition circuit and a wiring terminal, and the switching function of the electric conduction sensor is realized; the signal processing circuit is composed of a rectifying circuit and a filtering circuit, so that the function of preprocessing the output signal of the electric conduction sensor and transmitting the pre-processed signal to the signal receiving device isachieved. On the basis that the wall surface is not transformed, the problem that the existing measuring system cannot achieve multi-point continuous measurement of the liquid film thickness is solved.

Description

technical field [0001] The invention relates to a device for measuring liquid film thickness, in particular to a device for realizing multi-point real-time measurement of wall surface liquid film thickness, which can be applied to liquid film thickness monitoring work in nuclear energy, chemical industry and other fields. Background technique [0002] The reactor containment is the last barrier to stop radioactive material from leaking into the environment. When a core meltdown accident occurs, the temperature and pressure inside the containment gradually rise, which may eventually destroy the integrity of the containment and cause the leakage of radioactive substances. In order to prevent such accidents, the AP1000 reactor adopts the method of falling film cooling to control the pressure in the containment, that is, the temperature of the containment is cooled by the evaporation heat exchange effect of the thin liquid film on the outer surface of the steel containment, so t...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B7/06
CPCG01B7/06
Inventor 谷海峰于汇宇周艳民孙中宁陈皞曹夏昕王建军阎昌琪
Owner HARBIN ENG UNIV
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