Single event hardening-based programmable double-data-rate register circuit and control method

Abstract

The invention discloses a single event hardening-based programmable double-data-rate register circuit and a control method. A circuit with a dual-redundancy interlocking structure is adopted for a conventional latch to realize single event hardening design of a register storage unit; and based on this, a clock generation circuit, a data multiplexer and a data retaining circuit are added for controlling a time sequence of multiple registers with dual-redundancy interlocking structures, so that multi-mode double-data-rate register functions can be realized. A single event hardening index is improved by three orders of magnitude in comparison with that of a conventional register, and programmable functions of a level latch, a single-data-rate edge trigger, a reverse-edge-mode double-data-rateedge trigger, a same-edge-mode double-data-rate edge trigger and the like can be realized, so that higher flexibility, better time sequence performance and extremely high anti-single event hardeningindex are achieved during use of a programmable user register by a user.

Description

technical field [0001] The invention relates to a single-particle hardened programmable double data rate register circuit and a control method, in particular to a programmable single-particle hardened register circuit and a control method optimized for the application requirements of programmable logic devices, belonging to an integrated circuit field. Background technique [0002] Programmable logic devices have the advantages of high flexibility, low cost, and short cycle time. They can greatly shorten the product development cycle and minimize risks. They have become core components in the integrated circuit industry. The programmable user register is the core circuit in the programmable logic device to realize the user's sequential logic function, and can be programmed to realize various sequential functions according to the user's needs. [0003] On the other hand, due to the influence of the spatial single event effect, the data in the programmable user register will ...

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Problems solved by technology

[0003] On the other hand, due to the influence of the spatial single event effect, the data in the programmable user register will be single-event flipped, causing errors in user stored data. If the programmable user register with single-event flipping is used as a key state machine, it will Make this user function interrupt

[0004] Traditional single-event hardening methods use dual-mode redundancy, triple-mode redundancy, etc. to harden memories and flip-flops, but have limited hardening capabilities for programmable logic devices

At the same time, these programmable user registers need to be able to work at a very high data transfer rate, using traditional hardening methods in double data rate registers will bring a huge area requirement, and it is difficult to meet the requirements of high-speed transmission

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