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213results about How to "Small area overhead" patented technology

Built-in self-test structure and method for on-chip network resource node storage device

The invention discloses a built-in self-test structure and method for an on-chip network resource node storage device. The built-in self-test structure comprises a built-in self-test (BIST) controller arranged on a field programmable gate array (FPGA) chip, a resource network interface and a BIST interface which are embedded into corresponding routers, a test pattern generator and a test response analyzer, wherein the BIST controller is connected with external test equipment through an external interface. The built-in self-test method comprises the following steps that: the external test equipment sends an instruction start test program to the BIST controller; the BIST controller sends an enabling signal and a state selection signal to each test module according to a March C+ test algorithm program, performs read-write operation on each address of a static random access memory (SRAM) under each test state, and stops sending the signals if failures are found out. A test result is sent to the external test equipment. According to the built-in self-test structure and method, the test time is reduced by 50 percent; a routing network of a network operation center (NoC) is reused as a test data route; data transmission is reliable and safe; a chip area is low in expense; the failure coverage rate is high.
Owner:GUILIN UNIV OF ELECTRONIC TECH

Operational amplifier circuit and reference voltage generating circuit module

The invention discloses an operational amplifier circuit. The operational amplifier circuit comprises an operational amplifier and a chopping offset elimination circuit for eliminating an offset signal and flicker noise of the operational amplifier. The invention further discloses a reference voltage generating circuit module. The reference voltage generating circuit module comprises a reference voltage generating circuit, an operational amplifier, a chopping offset elimination circuit and a filtering circuit, wherein the reference voltage generating circuit is used for generating voltage with a zero temperature coefficient and current with a zero temperature coefficient; the operational amplifier is used for providing feedback for the reference voltage generating circuit in order that the output of the reference voltage generating circuit is stabilized at a required working point; the chopping offset elimination circuit is used for modulating the inherent offset voltage and the low-frequency flicker noise of the operational amplifier in order to modulate the influence of the offset of the operational amplifier on a reference voltage generated by the reference voltage generating circuit; and the filtering circuit is used for filtering the offset signal modulated by the offset elimination circuit and keeping a useful reference voltage signal. Through adoption of the operational amplifier circuit and the reference voltage generating circuit module, the offset and the flicker noise of the operational amplifier can be eliminated, and the accuracy is increased.
Owner:SHANGHAI HUAHONG INTEGRATED CIRCUIT
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