Radiation hardened latch based on heterogeneous double modular redundancy

Abstract

The invention relates to a radiation hardened latch based on a heterogeneous double modular redundancy. The radiation hardened latch comprises a first storage unit, a transmission unit, a second storage unit and a C unit; signal input ends of the first storage unit, the transmission unit and the second storage unit are all connected to an input signal D, a signal output end of the first storage unit is connected to a first signal input end of the C unit, a signal output end of the second storage unit is connected to a second signal input end of the C unit, a signal output end of the transmission unit is connected to a signal output end of the C unit, and the signal output end of the C unit serves as an output end of the radiation hardened latch. Because of the SET filtering function of a schmitt trigger, the latch filters a SET pulse in a transparency period; the first storage unit and the second storage unit used in the invention both have a capacity of tolerating single event upset and double node upset, and are combined with the C unit, so that the latch can tolerate the single event upset and multi-node upset, and has very good fault-tolerance performance.

Description

technical field [0001] The invention relates to the technical field of radiation-resistant integrated circuit design, in particular to a radiation-resistant hardened latch based on heterogeneous dual-mode redundancy. Background technique [0002] In the aviation environment, due to the influence of cosmic rays, various particles will be produced, including alpha particles, protons and neutrons. When these particles hit the aircraft, it will cause single event transient SET or single event in the circuit in the chip. Flipping SEUs, and even multi-point flipping MNUs will occur as the size of integrated circuits shrinks. This flips the logic value stored in the circuit, causing a functional error in the circuit. Therefore, in order to make the circuit perform the correct function, it is necessary to carry out anti-radiation hardening design on the circuit. [0003] Latches are commonly used sequential logic devices, so an important aspect of anti-radiation hardening design i...

AI Technical Summary

Problems solved by technology

Currently commonly used reinforcement methods mainly include process and design. The process mainly refers to layout-level reinforcement. In terms of design, the current classics mainly include triple-mode redundancy and DICE (Dual-Interlocked storage Cell), but they can only tolerate single-point Flip, and triple-mode redundancy has a large area overhead, delay and power consumption

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