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Wide area ADC error correction test method and device

An error correction and test method technology, applied in the field of testing, can solve the problems of reducing test efficiency, cumbersome process, inconvenient operation, etc., and achieve the effect of convenient error correction test

Active Publication Date: 2018-08-10
CASIC DEFENSE TECH RES & TEST CENT
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Problems solved by technology

However, this method requires a large number of measurements and calculations. The result of one calculation is not universal to different circuits or components, and the measurement and calculation must be performed again. The process is cumbersome and inconvenient to operate, which greatly increases the work of those skilled in the art. At the same time, the accuracy of the estimated error depends on the accuracy of the measurement of the resistance of the peripheral operational amplifier circuit, and the measurement error will directly affect the accuracy of error compensation, thus reducing the accuracy of ADC test results

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  • Wide area ADC error correction test method and device

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Embodiment Construction

[0034] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0035] Such as figure 1 As shown, it is a schematic flow chart of a wide-area ADC error correction test method according to an embodiment of the present invention. The wide-area ADC error correction test method provided in Embodiment 1 of the present invention includes:

[0036] Step 11. Synchronous drive: use the same signal source to synchronously drive the ADC to be tested and the standard ADC through the same group of peripheral operational amplifier circuits, so that the ADC to be tested and the standard ADC perform analog-to-digital conversion at the same time; the signal source is high-precision The signal source, specifically, the signal source adopts a signal source of more than 24 bits; the standard ADC adopts a...

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Abstract

The invention discloses a wide area ADC error correction test method and device. The error caused by the peripheral operational amplifier circuit is obtained by using standard ADC analysis and error compensation is performed on the ADC to be tested so that the influence of the error of the peripheral operational amplifier circuit on the ADC to be tested can be eliminated, the real performance of the ADC to be tested can be accurately reflected, the conditions can be provided for the more accurate ADC test in the future and the wide area ADC error correction test can be realized; meanwhile, when the signal source or the peripheral circuit or the ADC to be tested changes, the user does not need to perform recalculation so that error correction test can be conveniently performed on differentADC to be tested.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a wide-area ADC error correction testing method and device. Background technique [0002] Wide-area ADC (Analog-to-Digital Converter, analog-to-digital converter) generally refers to an ADC with a wide range of input analog voltages, and its function is to convert analog signals into digital signals. Limited by the hardware and software resource capabilities of the current integrated circuit test equipment, it is necessary to increase the peripheral operational amplifier circuit to indirectly improve the hardware resource capability of the test equipment during wide-area ADC detection to meet the needs of detection. However, the introduction of peripheral operational amplifiers At the same time, the circuit also introduces errors brought by peripheral operational amplifier circuits, which will affect the test accuracy of the ADC test and reduce the reliability of the ADC test res...

Claims

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/2853
Inventor 杨景阳刘路扬陈波吕兵吕乐刘净月
Owner CASIC DEFENSE TECH RES & TEST CENT
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