Prediction method for storage life of plastic packaged photoelectric coupler

A photoelectric coupler, storage life technology, applied in the direction of instruments, electrical digital data processing, special data processing applications, etc., can solve the problems of shortening the test time, failure mechanism consistency of life prediction cannot be guaranteed, and accelerated physical model prediction, etc.

Active Publication Date: 2018-08-10
BEIHANG UNIV
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  • Abstract
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  • Application Information

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Problems solved by technology

[0005] 1. Purpose: The purpose of this invention is to solve the above problems and provide a method for predicting the storage life of plastic-encapsulated photocouplers. It is a method based on accelerated physical model prediction, which can solve the problem that the failure mechanism of traditional life prediction cannot be guaranteed. Problem, compared with the traditional test method, using the life prediction method of the present invention can keep the failure mechanism consistent in the test, shorten the test time, and cancel the test cost

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  • Prediction method for storage life of plastic packaged photoelectric coupler
  • Prediction method for storage life of plastic packaged photoelectric coupler
  • Prediction method for storage life of plastic packaged photoelectric coupler

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Embodiment Construction

[0055] Below in conjunction with accompanying drawing and embodiment 1, the present invention will be described in further detail.

[0056] A method for predicting the storage life of a plastic-encapsulated photocoupler according to the present invention, the specific implementation process of the method is as follows figure 1 As shown, it is realized through the following steps:

[0057] Step 1: Determine sensitive parameters;

[0058] Select two samples of TLP250 plastic-encapsulated optocoupler, numbered pre-test 1#, and pre-test 2#. Before carrying out the test, measure the TLP20 performance parameter (I CEO , V OH , I R ), and then put the two devices into a high-temperature test chamber for high-temperature storage. The initial temperature of the step is set to 125°C, and it is taken out every 48 hours to measure the electrical performance parameters (I CEO , V OH , I R ), if the device does not fail, the temperature is increased by 15°C, and the test is continue...

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Abstract

The invention provides a prediction method for storage life of a plastic packaged photoelectric coupler. The method comprises the following seven steps of 1, determining sensitive parameters; 2, defining a physical acceleration model; 3, determining a temperature stress for keeping a failure mechanism unchanged; 4, carrying out an acceleration life test; 5, preprocessing test data; 6, estimating parameter values in the physical model; and 7, calculating the service life of the plastic packaged photoelectric coupler under a storage stress. The method is novel in conception and simple in program, can calculate the service life of the plastic packaged photoelectric coupler in a storage state, reflects the failure mechanism, can reduce the cost, solves the problem that conventional service life prediction cannot ensure failure mechanism consistency, and has wide application prospects in the field of component storage life evaluation.

Description

(1) Technical field [0001] The invention provides a method for predicting the storage life of a plastic-encapsulated photocoupler, which belongs to the technical field of storage life prediction. (2) Background technology [0002] Plastic-encapsulated optocoupler (referred to as plastic-encapsulated optocoupler), which includes a light emitter and a light detector unit, uses light as a medium to transmit signals through "electricity-optical-electricity" conversion, the input end uses infrared light-emitting diodes, and the output end usually uses triodes. . The plastic-encapsulated optocoupler has the characteristics of high isolation voltage, one-way transmission, and strong anti-electromagnetic interference ability. It is widely used in weaponry and equipment. The life of the plastic-encapsulated optocoupler directly affects the reliability of weaponry and equipment. After the plastic-encapsulated optocoupler is installed on the circuit board, it will not be put into use ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCG06F30/20G06F2119/04
Inventor 高成熊园园杨达明
Owner BEIHANG UNIV
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