Decoder and electronic device with such decoder

Abstract

The invention provides a decoder and an electronic device with such decoder. The decoder comprises the first number of control bits and 2m lines of switch arrays controlled by the control bits, wherein m is a natural number, the switch arrays of each line comprise n1 lines and n2 columns of MOSFETs, the MOSFETs comprise N type MOSFETs and P type MOSFET, the number of the N type MOSFETs controlledby each control bit and the number of the P type MOSFETs controlled by each control bit both are 2n, n is a variable, n is the natural number, value of n decreases progressively based on a descendingorder of the control bits, some MOSFETs controlled by the control bits are distributed evenly in the 2m lines of switch arrays, and line numbers of the switch arrays, where some MOSFETs controlled bythe control bits are located, are arranged in the form of a second order arithmetic progression. With the decoder and the electronic device with such decoder, layout of the switches of the decoder canbe optimized, and influence on the decoder caused by gradient errors and temperature field errors can be reduced.

Description

technical field [0001] The invention relates to the technical field of control circuits, in particular to a decoder and an electronic device with the decoder. Background technique [0002] A decoder is a circuit that can translate an input binary code into an output signal to represent its original meaning. The layout of the switch of the decoder is very important and directly affects the performance index of the decoder. [0003] An important performance index of the decoder is the current source matching error, and the current source matching error is mainly manifested in the layout design of the switch of the decoder: [0004] (1) Random matching error. The random error is determined by the matching characteristics and depends on the size of the unit switch. Usually, the size of the unit switch tube is increased as much as possible to reduce the adverse effects of the random matching error on the circuit, but at the same time it will make the switch Arrays have larger a...

AI Technical Summary

Problems solved by technology

In the switch array, since the units and devices are connected by metal, there is resistance in the metal connection, and there is a gradient change in the voltage along the direction of the power line, and this voltage gradient change will cause a gradient error in the switch

[0006] (3) Temperature field error. The chip will dissipate heat when working, so that the temperature on the chip will gradually decrease from a certain point to the surroundings, resulting in a certain temperature field error for each switch of the chip. For a large-area switch tree array, especially obvious

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