Method for calibrating crystal polarization through radio frequency signal

Abstract

The invention provides a method for calibrating crystal polarization through a radio frequency signal, and belongs to the field of the communication. The method comprises the following steps: step S1,a radio frequency port of a tested device is connected with one end of a radio frequency line through a copper pipe connector, the other end of the radio frequency line is connected with a wireless local area network WLAN tester, and the WLAN tester is connected with a control end; step S2, a user controls the WLAN tester to test the radio frequency signal of the tested device through the controlend so as to obtain a testing result, and the user judges whether the deviation of the radio frequency signal is qualified according to the testing result; if the deviation of the radio frequency signal is qualified, the user exits the testing; and if the deviation of the radio frequency signal is unqualified, the user regulates the crystal circuit of the tested device, and then turns to step S2.The method provided by the invention has the advantages that the method cannot be influenced by a probe, and the measurement is more accurate.

Description

technical field [0001] The invention relates to the communication field, in particular to a method for calibrating frequency deviation of a crystal through a radio frequency signal. Background technique [0002] Now the frequency of high-speed signals is getting higher and higher, and the requirements for the frequency deviation of the crystal are becoming more and more strict. When the crystal and the load capacitance do not match, the frequency deviation of the crystal will be too large, resulting in system instability. In radio frequency (Radio Frequency, RF) will affect performance even more. The current problem is that the crystal clock and external load capacitors are designed based on empirical values, which is difficult to meet the requirements of high-precision clocks. The current problem is that the crystal clock and external resistors are designed based on empirical values, which is difficult to meet the requirements of high-precision clocks. [0003] Aiming at ...

AI Technical Summary

Problems solved by technology

[0004] 1) Use an oscilloscope to directly measure the clock frequency on the transistor pin, but the measurement is inaccurate. The oscilloscope probe will affect the load capacitance, and the deviation is large;

[0005] 2) Using a frequency meter to directly measure the clock frequency on the transistor pin will still affect the load capacitance, resulting in inaccurate test results

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