Check patentability & draft patents in minutes with Patsnap Eureka AI!

Digital circuit fault injection method based on simulation

A fault injection and digital circuit technology, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve the problems that cannot be put into use in time, the system development cycle is long, etc., and achieve the effect of rapid realization

Active Publication Date: 2018-08-21
XIAN MICROELECTRONICS TECH INST
View PDF5 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The current research has designed a lot of fault injection platforms for front-end simulation, and these platforms are systematic, can provide a variety of fault injection mechanisms, and automatically analyze the operation of the processor after fault injection; but because of the current The comprehensive and systematic method leads to the fact that such a set of fault injection and analysis platform needs to invest more manpower and material resources to complete its development, and the development cycle of the system is also longer, so it cannot be put into use in the early stage of front-end design, or in the Due to the imperfection of the scheme itself, it is impossible and unnecessary to use such a systematic verification and evaluation scheme to test the fault-tolerant effect of each design point in the scheme demonstration and scheme realization phases of the reinforcement design.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Digital circuit fault injection method based on simulation

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] The present invention is described in further detail below in conjunction with accompanying drawing:

[0033] see figure 1 , the simulation-based digital circuit fault injection method of the present invention includes creating a target signal list, acquiring target signals, and fault injection. The technical solution adopted should support the flexible operation of multi-signal lists, the fault injection type can be set, and the fault duration can be set. In addition to realizing the fault injection of specified signals, it is also possible to realize random injection of faults and multi-point fault injection. The invention can be realized conveniently on the digital circuit simulation verification platform. In the present embodiment, random fault injection is used as an example to introduce the basic idea of ​​the present invention, and the fault injection of other specified signals can also be realized with reference to this method; the embodiment adopts VHDL langua...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a digital circuit fault injection method based on simulation. The digital circuit fault injection method comprises the steps that a target signal list is created, target signals are obtained, and faults are injected. The adopted technical scheme supports flexible operation of multiple signal lists, fault injection types can be set, the duration time of faults can be set, and random fault injection and multi-point fault injection can be also achieved except fault injection of designated signals. The digital circuit fault injection method is based on simulation, does notneed to modify VHDL models, is directly achieved in Test Bench (TB) by adopting simple, short efficient codes and can simply and quickly support the verification of reliability design. The method is simple and easy to carry out, can be quickly achieved, is flexible to use, can effectively simulate fault phenomena such as internal level turnover of a processor under an actual environment.

Description

technical field [0001] The invention belongs to the technical field of digital circuits, and relates to a simulation-based digital circuit fault injection method. Background technique [0002] In recent years, with the continuous shrinking of the feature size of integrated circuits, the performance of processors has been rapidly improved. However, such high integration, low threshold voltage and high operating frequency make processors less sensitive to crosstalk, electromagnetic interference and particle radiation. The influence of the processor is more sensitive, and it is easy to cause various failures of the processor, which poses a severe challenge to the reliability of the processor. In order to overcome these challenges, it is necessary to carry out a fault-tolerant design on the processor, take appropriate protective measures to enhance circuit reliability, and ensure the normal operation of various functions of the system as much as possible. [0003] In processor ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F17/50
CPCG06F30/398
Inventor 闫鑫周泉杨靓
Owner XIAN MICROELECTRONICS TECH INST
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More