Calibration method of linear structured light three-dimensional measurement system

A technology of three-dimensional measurement and line structured light, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve problems such as three-dimensional measurement errors, achieve the effects of improving calculation speed, simplifying the calibration system, and avoiding errors

Active Publication Date: 2018-08-28
XI AN ZHISENSOR TECH CO LTD
View PDF5 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in practical applications, due to the defects of the line light source, the projected outgoing lines will be slightly bent, which will c

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Calibration method of linear structured light three-dimensional measurement system
  • Calibration method of linear structured light three-dimensional measurement system
  • Calibration method of linear structured light three-dimensional measurement system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0037] From figure 1 It can be seen that in this embodiment, the three-dimensional measurement system to be calibrated is mainly composed of a camera and a line-structured light projector. 1024 lines are projected: l 1 ~l 1024 .

[0038] build as figure 2 In the calibration system shown, the plane plate 1 has a size of 1.5m*1.5m and a thickness of 10mm. The material is acrylic board, and 1.5m*1.5m flat white paper is pasted on the surface, and a 20*20 checkerboard is printed in the center of the white paper to calibrate the target 5, and the size of each cell of the calibrated target 5 is a 30mm square. Optical rail 2, 1.5m long. Equipped with a slider 3 and a three-degree-of-freedom micro-motion platform 4, D can rotate around three axes in space with a maximum rotation angle of 3°.

[0039] Calibration process such as image 3 shown, follow...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
Thicknessaaaaaaaaaa
Login to view more

Abstract

The invention relates to a calibration method of a linear structured light three-dimensional measurement system. According to the calibration method, a camera is calibrated according to a conventionalmethod, so that the internal parameters and external parameters of the camera can be obtained; coded structured light is projected onto the plane plate of a calibration system through using a projector; the sub-pixel-level coordinates of all lines in a photo which are projected by the projector are obtained by means of image processing or decoding; a line-plane equation is established according to the internal parameters and the external parameters of the camera; the three-dimensional coordinates of all the projected lines on the plane plate are calculated through line-plane intersection points; after the three-dimensional measurement system or the plane plate is moved, the three-dimensional coordinates of all the projected lines after the system or the plane plate is moved are obtained;and surface fitting is performed on each projected line according to the obtained three-dimensional coordinate data, and the surface equations of light surfaces formed by all the projected lines are obtained; and a surface coefficient table is established with the coefficients of the surface equations, and calibration is completed. With the calibration method adopted, the influence of the bendingof a line source can be eliminated. The method has the advantages of simple and quick calibration process, easiness in operation, error small and high calibration accuracy.

Description

technical field [0001] The invention belongs to the field of optical three-dimensional measurement, and in particular relates to a calibration method for a line structured light three-dimensional measurement system. The method is used for quickly calibrating the line structured light three-dimensional measurement system, and eliminates the influence of the bending of the line light source on the three-dimensional measurement. Background technique [0002] The three-dimensional measurement system based on one-dimensional line structured light has the advantages of high measurement accuracy, fast measurement speed, and large amount of information. It has a wide range of applications in reverse engineering, face recognition, industrial measurement and other fields. The general measurement process includes: projecting a structured light coding pattern to the target object with a line structured light projector, and then synchronously shooting with a camera, establishing a triangu...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01B11/25
CPCG01B11/2504
Inventor 杨迪乔大勇夏长锋
Owner XI AN ZHISENSOR TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap