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A Calibration Method for a Line Structured Light 3D Measuring System

A technology of three-dimensional measurement and linear structured light, which is applied to measuring devices, optical devices, instruments, etc., can solve problems such as three-dimensional measurement errors, and achieve the effect of improving calculation speed, convenient operation process, and low requirements.

Active Publication Date: 2020-01-03
XI AN ZHISENSOR TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, in practical applications, due to the defects of the line light source, the projected outgoing lines will be slightly bent, which will cause the projected outgoing light to form a light surface instead of a light plane, which will bring errors to the three-dimensional measurement.

Method used

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  • A Calibration Method for a Line Structured Light 3D Measuring System
  • A Calibration Method for a Line Structured Light 3D Measuring System
  • A Calibration Method for a Line Structured Light 3D Measuring System

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Embodiment Construction

[0036] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0037] From figure 1 It can be seen that in this embodiment, the three-dimensional measurement system to be calibrated is mainly composed of a camera and a line-structured light projector. 1024 lines are projected: l 1 ~ l 1024 .

[0038] build as figure 2 In the calibration system shown, the plane plate 1 has a size of 1.5m*1.5m and a thickness of 10mm. The material is acrylic board, and 1.5m*1.5m flat white paper is pasted on the surface, and a 20*20 checkerboard is printed in the center of the white paper to calibrate the target 5, and the size of each cell of the calibrated target 5 is a 30mm square. Optical rail 2, 1.5m long. Equipped with a slider 3 and a three-degree-of-freedom micro-motion platform 4, D can rotate around three axes in space with a maximum rotation angle of 3°.

[0039] Calibration process such as image 3 shown, follo...

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Abstract

The invention relates to a calibration method of a linear structured light three-dimensional measurement system. According to the calibration method, a camera is calibrated according to a conventionalmethod, so that the internal parameters and external parameters of the camera can be obtained; coded structured light is projected onto the plane plate of a calibration system through using a projector; the sub-pixel-level coordinates of all lines in a photo which are projected by the projector are obtained by means of image processing or decoding; a line-plane equation is established according to the internal parameters and the external parameters of the camera; the three-dimensional coordinates of all the projected lines on the plane plate are calculated through line-plane intersection points; after the three-dimensional measurement system or the plane plate is moved, the three-dimensional coordinates of all the projected lines after the system or the plane plate is moved are obtained;and surface fitting is performed on each projected line according to the obtained three-dimensional coordinate data, and the surface equations of light surfaces formed by all the projected lines are obtained; and a surface coefficient table is established with the coefficients of the surface equations, and calibration is completed. With the calibration method adopted, the influence of the bendingof a line source can be eliminated. The method has the advantages of simple and quick calibration process, easiness in operation, error small and high calibration accuracy.

Description

technical field [0001] The invention belongs to the field of optical three-dimensional measurement, and in particular relates to a calibration method for a line structured light three-dimensional measurement system. The method is used for quickly calibrating the line structured light three-dimensional measurement system, and eliminates the influence of the bending of the line light source on the three-dimensional measurement. Background technique [0002] The three-dimensional measurement system based on one-dimensional line structured light has the advantages of high measurement accuracy, fast measurement speed, and large amount of information. It has a wide range of applications in reverse engineering, face recognition, industrial measurement and other fields. The general measurement process includes: projecting a structured light coding pattern to the target object with a line structured light projector, and then synchronously shooting with a camera, establishing a triangu...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
CPCG01B11/2504
Inventor 杨迪乔大勇夏长锋
Owner XI AN ZHISENSOR TECH CO LTD
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