Automatic quality classifying device and method for solar polycrystalline silicon chips
A polycrystalline silicon wafer, automatic sorting technology, applied in sorting and other directions, can solve the problems of low intelligence, low detection quality, low work efficiency, etc., to improve the degree of mechanization, improve work efficiency, and reduce manual screening.
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[0021] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. The embodiments in the invention, and all other embodiments obtained by those of ordinary skill in the art without creative work, fall within the protection scope of the invention.
[0022] See Figure 1-3 , The present invention provides a technical solution: an automatic quality classification device for solar polycrystalline silicon wafers, including a device main body 1, a detection device 2 and a summarizing device 5. The left end of the device main body 1 is provided with a detection device 2, the detection device 2 and the device main body 1. Electrically connected, the top of the detection device 2 is provided with an organic top co...
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