Abnormality detection apparatus and machine learning apparatus

An anomaly detection and machine learning technology, applied in machine learning, measuring devices, neural learning methods, etc., can solve problems such as inability to detect processing content, inability to apply anomaly detection, etc.

Inactive Publication Date: 2018-10-09
FANUC LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, in the technique disclosed in Japanese Patent Application Laid-Open No. 2007-52797, there is a problem that sampling points corresponding to specific programs or processing contents need to be set in advance, and abnormalities unrelated to processing contents, etc. cannot be detected.
In addition, in the technique disclosed in Japanese Patent Laid-Open No. 05-285788, there is a problem that it cannot be applied to abnormality detection during processing because it needs to perform predetermined actions during inspection.

Method used

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  • Abnormality detection apparatus and machine learning apparatus
  • Abnormality detection apparatus and machine learning apparatus
  • Abnormality detection apparatus and machine learning apparatus

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Embodiment Construction

[0028] figure 1 It is a schematic functional block diagram of the abnormality detection apparatus 10 of 1st Embodiment. The abnormality detection device 10 includes a machine learning device 20 for autonomously learning, by so-called machine learning, the value of a physical quantity (current value or speed value of a spindle motor / servo motor) detected during machining performed in a normal operating machine tool. , the vibration value detected from the machine tool, the audible sound, etc.) related to the software (learning algorithm, etc.) and hardware (computer CPU, etc.) equivalent to one processing cycle or waveform data of an arbitrary interval. The content learned by the machine learning device 20 included in the abnormality detection device 10 corresponds to a model structure corresponding to one machining cycle or waveform data of an arbitrary interval related to the value of a physical quantity detected from a machine tool operating normally during machining.

[00...

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PUM

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Abstract

The invention relates to an abnormality detection apparatus for machining states and a machine learning apparatus. The abnormality detection apparatus includes a machine learning apparatus for learning waveform data concerning a physical quantity detected when a machine tool is normally operating. The machine learning apparatus observes the waveform data concerning the physical quantity detected when the machine tool is normally operating, as a state variable indicating a current environmental state, and learns a feature of the waveform data concerning the physical quantity detected when the machine tool is normally operating, using the observed state variable.

Description

technical field [0001] The invention relates to an abnormality detection device and a machine learning device of a processing state. Background technique [0002] In machine tools, machining defects occur due to wear and tear of tools, fluctuations in machining loads, changes in machining environments such as cutting fluids, disturbances, and the like. In addition, machining defects sometimes occur due to reprocessing of processed workpieces. These are not normal processing states, and it is desired to detect abnormalities in these processing states so as to be able to preemptively determine the occurrence of processing defects. [0003] As a prior art for detecting abnormalities in the processing state, for example, Japanese Patent Application Laid-Open No. 2007-52797 discloses the following technology: preset sampling points according to the program or processing content, and calculate the average value or standard deviation value of each sampling point On the other hand...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/406G05B19/4065G01D21/02G06N99/00G07C3/00G06N20/00
CPCG01D21/02G05B19/406G05B19/4065G07C3/005G06N20/00G06N3/088G05B2219/49307G05B23/0229G06N3/045G05B19/00G05B19/4063G05B19/404B23Q17/007B23Q2717/00
Inventor 玉井孝幸奥田真司
Owner FANUC LTD
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