Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Methods of data output from semiconductor image detector

A technology for output terminals and image detection, applied in image communication, instruments, static memory, etc., can solve the problems of cumbersome thermal management, impossible production, difficult production of detectors, etc.

Active Publication Date: 2018-10-23
SHENZHEN XPECTVISION TECH CO LTD
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The cumbersome thermal management required in currently available semiconductor X-ray detectors (e.g., Medipix) makes the production of detectors with large areas and large numbers of pixels difficult or impossible

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Methods of data output from semiconductor image detector
  • Methods of data output from semiconductor image detector
  • Methods of data output from semiconductor image detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0057] Figure 1A A cross-sectional view of the X-ray image detector 100 according to the embodiment is schematically shown. The detector 100 may include an X-ray absorbing layer 110 and an electronic layer 120 (for example, an ASIC) for processing or analyzing electrical signals generated in the X-ray absorbing layer 110 by incident X-rays. In an embodiment, detector 100 does not include a scintillator. The X-ray absorbing layer 110 may include semiconductor materials such as silicon, germanium, GaAs, CdTe, CdZnTe or combinations thereof. Semiconductors can have high mass attenuation coefficients for x-ray energies of interest.

[0058] as in Figure 1B As shown in the detailed cross-sectional view of the detector 100, according to an embodiment, the X-ray absorbing layer 110 may include one or more discrete regions 114 formed from the first doped region 111 and the second doped region 113 One or more diodes (for example, p-i-n or p-n). The second doped region 113 may be ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

Disclosed herein is an apparatus suitable for detecting an image, comprising: a plurality of pixels (150) configured to generate an electric signal upon exposure to a radiation; an electronics system(121) associated with each of the pixels (150), wherein the electronics system (121) comprises a first memory (641) on a first signal path (631) and a second memory (642) on a second signal path (632), both signal paths (631, 632) being between an input terminal (601) and an output terminal (602) of the electronics system (121); wherein each of the first memory (641) and the second memory (642) isconfigured to store the electric signal generated by the pixel (150) the electronics system (121) is associated with, configured to store the electric signal generated in another pixel (150), and configured to transmit the electric signal stored in the electronics system (121) to another pixel (150); wherein the electronics system (121) comprises a switch (610, 620) configured to select one of the signal paths (631, 632).

Description

【Technical field】 [0001] The present disclosure relates to methods of reading data from semiconductor image detectors, particularly semiconductor X-ray image detectors. 【Background technique】 [0002] An X-ray detector may be a device for measuring the flux, spatial distribution, spectral or other properties of X-rays. [0003] X-ray detectors are used in many applications. An important application is imaging. X-ray detectors configured to detect X-ray images may be referred to as X-ray imaging detectors. X-ray imaging is a radiographic technique that can be used to reveal the internal structure of inhomogeneous and opaque objects such as the human body. [0004] Early X-ray detectors used for imaging included photographic negatives and photographic film. The photographic negative can be a glass negative with an emulsion coating. Although photographic negatives have been replaced by photographic films, they are still used in special cases due to the superior quality the...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G11C29/24G01T1/24
CPCH04N5/32G11C29/76G11C29/86G11C29/846G11C29/808H04N25/771G11C29/04G11C29/24
Inventor 曹培炎程华斌刘雨润
Owner SHENZHEN XPECTVISION TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products