Segmented judging method for Bypass events

An event and threshold technology, applied in instrumentation, calculation, electrical digital data processing, etc., can solve the problems of large three-phase current vector sum error, high complexity, increase the computing load of the main chip, etc., to avoid misjudgment and simple operation. Effect

Active Publication Date: 2018-10-26
NINGBO SANXING MEDICAL & ELECTRIC CO LTD
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Problems solved by technology

[0005] However, the existing bypass event judgment methods have the following technical problems: scheme 1 has high complexity and increases the computing load of the main chip; scheme 2, in the case of increasing the current, the three-phase current vector read from the metering chip The error of the sum is large, which is easy to cause misjudgment

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  • Segmented judging method for Bypass events

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Embodiment

[0023] A segmented judgment method for bypass events, which includes the following steps:

[0024] (1) Pre-divide multiple segmented intervals according to the size of the phase currents, and set different bypass thresholds according to the error variation characteristics of the actual three-phase current vector sum in different segmented intervals;

[0025] (2) Read the maximum phase current from the phase current register of the metering chip;

[0026] (3) Determine the segment interval where the maximum phase current is located, and obtain the bypass threshold according to the segment interval;

[0027] (4) Read the three-phase current vector sum from the metering chip current vector sum register, and read the zero-phase current from the metering chip zero-phase current register;

[0028] (5) Make the vector sum of the three-phase current vector sum and the zero-phase current again, and judge whether the magnitude of the vector sum is greater than the bypass threshold, if it is, then...

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Abstract

The invention discloses a segmented judging method for bypass events. The method is characterized by comprising the following steps of: (1) previously dividing a plurality of segment intervals according to current sizes, and setting different bypass threshold values in the segment intervals; (2) reading maximum phase current from a metering chip phase current register; (3) judging a segment interval where the maximum phase current is located and obtaining the bypass threshold value of the segment interval; (4) reading a three-phase current vector sum from a metering chip current vector sum register and reading zero-phase current from a metering chip zero-phase current register; and (5) carrying out vector addition on the three-phase current vector sum and the zero-phase current to judge whether a bypass event occurs or not. The segmented judging method for bypass events is simple to operate and is not easy to cause mistaken judgement even the current is enlarged.

Description

Technical field [0001] The present invention relates to the technical field of circuit detection, in particular to a method for segmentation judgment of bypass events. Background technique [0002] There are two main methods for judging bypass events: [0003] 1. Calculate the angle between each phase current according to the voltage phase angle and power angle, then calculate the vector sum of each phase current and the neutral current, and judge whether a bypass event occurs according to whether the vector sum is zero. [0004] 2. Read the three-phase current vector sum from the metering chip current vector sum register, and then make the difference with the zero-phase current. If the difference is greater than 2A, it is determined that a bypass event has occurred. [0005] However, the existing method for judging bypass events has the following technical problems: Scheme 1 is more complicated and increases the computational load of the main chip; Scheme 2 is the three-phase current...

Claims

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Application Information

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IPC IPC(8): G06F17/50
CPCG06F30/367
Inventor 屈俊力章跃平孟令超何涛黎小静
Owner NINGBO SANXING MEDICAL & ELECTRIC CO LTD
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