Segmented judging method for Bypass events

Abstract

The invention discloses a segmented judging method for bypass events. The method is characterized by comprising the following steps of: (1) previously dividing a plurality of segment intervals according to current sizes, and setting different bypass threshold values in the segment intervals; (2) reading maximum phase current from a metering chip phase current register; (3) judging a segment interval where the maximum phase current is located and obtaining the bypass threshold value of the segment interval; (4) reading a three-phase current vector sum from a metering chip current vector sum register and reading zero-phase current from a metering chip zero-phase current register; and (5) carrying out vector addition on the three-phase current vector sum and the zero-phase current to judge whether a bypass event occurs or not. The segmented judging method for bypass events is simple to operate and is not easy to cause mistaken judgement even the current is enlarged.

Description

Technical field [0001] The present invention relates to the technical field of circuit detection, in particular to a method for segmentation judgment of bypass events. Background technique [0002] There are two main methods for judging bypass events: [0003] 1. Calculate the angle between each phase current according to the voltage phase angle and power angle, then calculate the vector sum of each phase current and the neutral current, and judge whether a bypass event occurs according to whether the vector sum is zero. [0004] 2. Read the three-phase current vector sum from the metering chip current vector sum register, and then make the difference with the zero-phase current. If the difference is greater than 2A, it is determined that a bypass event has occurred. [0005] However, the existing method for judging bypass events has the following technical problems: Scheme 1 is more complicated and increases the computational load of the main chip; Scheme 2 is the three-phase current...

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Problems solved by technology

[0005] However, the existing bypass event judgment methods have the following technical problems: scheme 1 has high complexity and increases the computing load of the main chip; scheme 2, in the case of increasing the current, the three-phase current vector read from the metering chip The error of the sum is large, which is easy to cause misjudgment

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