Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Time error estimation and correction method for TIADC collection system

A time error and acquisition system technology, applied in analog/digital conversion calibration/testing, analog-to-digital converters, electrical components, etc., can solve problems such as estimated time mismatch error, solve time error calculation errors, and increase stability and correctness effects

Active Publication Date: 2018-11-13
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF8 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the existing error estimation methods cannot estimate the time mismatch error in the single-channel under-sampling mode, so designing a new time error estimation and correction method becomes an urgent problem to be solved in the high-speed parallel acquisition system

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Time error estimation and correction method for TIADC collection system
  • Time error estimation and correction method for TIADC collection system
  • Time error estimation and correction method for TIADC collection system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0040] figure 1 It is a principle diagram of a time error estimation and correction method of a TIADC acquisition system of the present invention.

[0041] In this example, if figure 1 As shown, a time error estimation and correction method of a TIADC acquisition system of the present invention comprises the following steps:

[0042] S1. Set the number of ADCs in the TIADC acquisition system as M=16, and the sampling rate of the single-channel ADC is f single ;Such as figure 2As shown, each channel is equivalent to a filter and ADC representing the frequency response of the channel, and the time error is determined by the frequency response filter H of the channel i (jω) said.

[0043] S2. Let the input frequency be f 0 The standard sinusoidal signal of x(t) is x(t), input x(t) into TIADC acquisition system, and sample x(t) to get the sampling data y of each ADC k [n],k=0,1,...,15;

[0044] S3. Find the sampling data y of each ADC k [n] mean a k , and then sample dat...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a time error estimation and correction method for a TIADC collection system. High frequency standard sinusoidal excitation is carried out on the TIADC system, thereby obtainingsampling data of each ADC. Spectrum leakage-free FFT is carried out on the sampling data of each ADC, thereby obtaining spectrums. A phase spectrum value of each ADC is precisely obtained through utilization of a frequency domain folding theory. A time error estimated value is obtained through utilization of the phase spectrum value of each ADC. The estimated values are corrected to obtain time error corrected values. A TIADC time error is corrected according to the time error corrected values and phase adjustment units in the ADCs.

Description

technical field [0001] The invention belongs to the technical field of time domain testing, and more specifically relates to a time error estimation and correction method of a TIADC acquisition system. Background technique [0002] With the rapid development of science and technology, represented by the GHz frequency band, UHF signals have been used more and more. Especially in the fields of communication, aerospace, and space exploration, the application of UHF signals is growing rapidly. In order to be able to accurately identify and measure these signals, higher requirements are placed on the sampling rate of the data acquisition system. The existing single-chip ADC can no longer meet the sampling requirements of these signals due to the limitations of materials and processes. Therefore, parallel acquisition technology has been extensively studied as a real-time acquisition technology for arbitrary signals. [0003] The structure of multi-chip ADC parallel alternate sam...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/10H03M1/12
CPCH03M1/1009H03M1/1245
Inventor 杨扩军叶芃潘志翔张沁川黄武煌
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com