Manipulator repeated positioning accuracy measuring device and method based on digital speckle interference

A technology of repeated positioning accuracy and measuring device, which is applied to manipulators, program-controlled manipulators, manufacturing tools, etc., can solve the problems of inability to directly realize attitude measurement and multi-point measurement, low measurement accuracy, and high environmental requirements, and achieve digital attitude adjustment. Flexible and convenient, high measurement accuracy, strong anti-interference effect

Active Publication Date: 2018-11-30
SUZHOU UNIV OF SCI & TECH
View PDF8 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] 1. Use three one-dimensional micrometers (or pull-wire encoders) for combined measurement in three mutually perpendicular directions. The measurement setup is complicated, contact measurement, and debugging work are heavy. The measurement accuracy is low and it is inconvenient to read the value. Realize attitude measurement and multi-point measurement
[0005] 2. Using a combination of one-dimensional laser ranging sensors in three directions perpendicular to each other for measurement, the workload of installing and adjusting mirrors or optical paths in different vertical directions and positions is large, and the three sets of measurement data need to be converted according to the relative installation positions For three-dimensional coordinates, attitude measurement and multi-point measurement cannot be directly realized
[0006] 3. Use the method of one-dimensional laser ranging sensor and gyroscope with three directions perpendicular to each other to measure three-dimensional coordinates and attitudes. The disadvantage is that the accuracy of the gyroscope is not high, and the four sets of measurement data need to be converted into three-dimensional coordinates and coordinates according to the relative position of the installation. Attitude, unable to achieve multi-dimensional integrated pose repeated positioning measurement
[0007] 4. Use a 3D laser scanner to measure the spatial shape of the manipulator, and then convert the attitude data, but the equipment has low measurement accuracy, high environmental requirements, large space occupation, and high cost
[0008] The above problems have not been effectively improved for many years

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Manipulator repeated positioning accuracy measuring device and method based on digital speckle interference
  • Manipulator repeated positioning accuracy measuring device and method based on digital speckle interference
  • Manipulator repeated positioning accuracy measuring device and method based on digital speckle interference

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0060] Figure 1 to Figure 7 It shows a specific embodiment of the device for measuring the repetitive positioning accuracy of a manipulator based on digital speckle interference in this application, which includes a manipulator, and the manipulator includes: a base 1, an arm part 2, a claw part (not shown in the figure) and Manipulator controller 3. Wherein the head end of the arm part 2 ( figure 1 The lower end) is connected to the aforementioned base 1, and the end of the arm portion 2 ( figure 1 middle and upper end) to install the aforementioned claws. When working, the arm part 2 moves to drive the claw part at the end to move to the working position, and then the claw part moves to directly grab / release the corresponding workpiece. The manipulator controller 3 is electrically connected with the aforementioned arm portion and the gripper portion, so as to control the movement of the aforementioned arm portion and the gripper portion. The base 1 is a fixed part, and...

Embodiment 2

[0085] Figure 8 It shows the second specific embodiment of the device for measuring the repetitive positioning accuracy of the manipulator of the present application. The difference from the first embodiment above is that the positions of the positioning target 5 and the visual detection device are exchanged in this embodiment. specifically:

[0086] The nano-adjustment table 4 is arranged at the end of the manipulator arm 2, the positioning target 5 is installed on the nano-adjustment table 4, the visual inspection device composed of the positioning camera 6 and the laser generating unit is arranged near the manipulator base 1, and the positioning camera 6 and the laser The position of the light emitting element at the end of the generating unit and the base 1 is relatively fixed.

[0087] The working principle of this embodiment is basically the same as that of Embodiment 1. During precision measurement, the pose of the positioning target is adjusted through the action of ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a manipulator repeated positioning accuracy measuring device based on digital speckle interference. The manipulator repeated positioning accuracy measuring device based on digital speckle interference comprises a manipulator. The manipulator comprises an arm part of which the tail end is used for mounting a gripper part, and further comprises a nanometer adjusting platformarranged at the tail end of the arm part and a positioning target provided with a diffuse reflection surface, a laser generation unit used for emitting a positioning light beam to the diffuse reflection surface of the positioning target and a positioning camera used for receiving light reflected from the diffuse reflection surface to present a speckle image in the positioning camera and being in circuit connection with the nanometer adjusting platform; the position of the positioning target is fixed relative to the ground; a light emergent element at the tail end of the laser generation unit and the positioning camera are both fixed to the nanometer adjusting platform. The manipulator repeated positioning accuracy measuring device based on digital speckle interference can measure the repeated positioning accuracy of the manipulator very accurately, and the technical level of repeated positioning measurement of the manipulator is improved comprehensively.

Description

technical field [0001] The present application relates to the technical field of manipulator positioning, in particular to a device and method for measuring repeat positioning accuracy of a manipulator based on digital speckle interferometry. Background technique [0002] The repeated positioning accuracy of the manipulator refers to the degree of consistency of the position and attitude (hereinafter referred to as pose) accuracy obtained by repeatedly running the same program code on the manipulator. The premise and foundation, its accuracy directly affects the product quality of the manipulator. [0003] In recent years, with the continuous development of automation technology, various manipulators have gradually become popular in the processing industry, and their mechanical precision, motion control, human-computer interaction and other technologies have reached a relatively high level. In positioning processing (such as: spot welding, assembly, etc.), the precision mea...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): B25J9/16
CPCB25J9/1692Y02E30/30
Inventor 李学哲李爽
Owner SUZHOU UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products