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A method and device for adjusting the perpendicularity of an optical axis

An adjustment method and verticality technology, which is applied in the field of optical measurement, can solve problems such as difficult implementation, and achieve the effect of correct angle adjustment, high accuracy and precision, and convenient adjustment

Active Publication Date: 2021-07-27
上海复瞻智能科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method requires the lens barrel to be able to generate outgoing light and accurately measure the offset of reflected light, but it is often difficult to implement due to limited conditions

Method used

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  • A method and device for adjusting the perpendicularity of an optical axis
  • A method and device for adjusting the perpendicularity of an optical axis
  • A method and device for adjusting the perpendicularity of an optical axis

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Experimental program
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Embodiment 1

[0050] see figure 1 as well as figure 2 , a method for adjusting the verticality of the optical axis, used to adjust the verticality of the optical axis of the imaging unit and the display surface of the display unit, comprising:

[0051] S1: The display unit displays a calibration pattern, and initially adjusts the position of the imaging unit so that the calibration pattern can be imaged at the center of the imaging unit; wherein, the calibration pattern includes a certain calibration circle;

[0052] S2: The imaging unit takes pictures of the calibration pattern to obtain a first shot image;

[0053] S3: Process the first captured image, perform ellipse fitting on the calibration circle in the first captured image, and obtain the first semi-minor axis endpoint vector of the first ellipse obtained through ellipse fitting Semi-major axis length l 1 , Minor semi-axis length l 2 , and the length difference Δ between the major and minor axes;

[0054]S4: Set the length di...

Embodiment 2

[0068] see Figure 4 , this embodiment discloses an optical axis perpendicularity adjustment device for implementing the method in Embodiment 1, including: a display unit 1 for displaying a calibration pattern, the calibration pattern includes a calibration rectangle and a calibration rectangle inscribed with the calibration rectangle Standard circle; Imaging unit 2, for imaging the calibration pattern; Adjusting unit 3, for adjusting the spatial position of imaging unit 2, and adjusting the angle of the optical axis of imaging unit 2 relative to the display surface of display unit 1; Image The processing unit 4 is used to process the photographed image acquired by the imaging unit 2; and the control unit 5 is used to control the adjustment unit 3 to adjust the spatial position of the imaging unit 2 according to the processing result of the image processing unit 4, or control the adjustment unit 5 to adjust The angle of the optical axis of the imaging unit 2 relative to the di...

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Abstract

The invention discloses a method for adjusting the perpendicularity of an optical axis. By performing ellipse fitting on images captured by an imaging unit, and using the length difference between the long semi-axis and the short semi-axis of the fitted ellipse as a criterion for judging the perpendicularity, The adjustment direction and the adjustment angle for adjusting the verticality are obtained, and the isotropic characteristic of the calibration circle is used to make the adjustment result have higher accuracy and precision. The present invention also provides an optical axis perpendicularity adjustment device, which mainly includes a display unit, an imaging unit, an adjustment unit, an image processing unit and a control unit.

Description

technical field [0001] The invention belongs to the field of optical measurement, and in particular relates to a method and a device for adjusting the perpendicularity of an optical axis. Background technique [0002] In a color analysis system based on the principle of CCD imaging, the deviation of the perpendicularity between the imaging colorimeter and the surface of the object to be measured will cause measurement errors, especially in high-precision testing, the error caused by small deflection angles cannot be ignored of. Therefore, realizing the high-precision perpendicularity between the imaging colorimeter and the measured object surface is one of the key links to realize accurate testing. [0003] At present, there are mainly the following two verticality adjustment methods: [0004] 1. Directly shoot the existing standard pattern and compare the diameter errors in different orientations. However, due to the secondary error of the pattern, the evaluation accurac...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/80
CPCG06T2207/30204G06T7/80
Inventor 侯丽敏孙亮
Owner 上海复瞻智能科技有限公司