Ultrasonic comprehensive factor graph identification detecting method of sleeve grouting fullness
A comprehensive factor, sleeve grouting technology, applied in the direction of material analysis, measurement device, instrument, etc. using sonic/ultrasonic/infrasonic waves, can solve the problems of difficult grouting density detection, inconsistency, and difficulty for testers to make final judgments, and achieve good results. Detect the effect of the effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0081] Hereinafter, an embodiment of an ultrasonic comprehensive factor pattern recognition detection method for sleeve grouting plumpness according to the present invention will be described with reference to the accompanying drawings. The examples described here are specific specific implementations of the present invention, and are used to illustrate the concept of the present invention. They are all explanatory and exemplary, and should not be construed as limiting the implementation of the present invention and the scope of the present invention. In addition to the embodiments described here, those skilled in the art can also adopt other obvious technical solutions based on the claims of the application and the contents disclosed in the description, and these technical solutions include adopting any obvious changes made to the embodiments described here. Replacement and modified technical solutions.
[0082] The accompanying drawings in this specification are schematic di...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com