Method for Improving Data Processing Accuracy in Photoelectric Sensing Array Measuring Refractive Index
A technology of photoelectric sensing and data processing, applied in the field of measurement and optics, to achieve the effect of improving accuracy and improving a wide range
Active Publication Date: 2020-06-09
HUAZHONG UNIV OF SCI & TECH
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[0005] At present, the technology of measuring the refractive index of array devices to obtain the critical angle position is only single-pixel accuracy, and the measurement accuracy is of the order of magnitude
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[0038] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.
[0039] The invention discloses a parabolic interpolation sub-pixel position acquisition method based on the measurement of the refractive index of an array optoelectronic semiconductor device. The method of the present invention is based on the traditional photoelectric sensing array system device for measuring the refractive index, provides a new sub-pixel acquisition method in the refractive i...
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The invention discloses a method for improving the data processing precision in measuring the refractive index of a photoelectric sensing array, which relates to the technical field of measurement andoptics. The method for improving the data processing precision comprises the following steps: first, using the photoelectric sensing array device to detect the light intensity data and calculate thepixels corresponding to the critical angle according to the light intensity data; second, taking m pixels before and after the pixel position corresponding to the critical angle-a total of <2m+1> pixels, and acquiring the reflectivity corresponding to the <2m+1> pixels as fitting data; third, adopting the Gaussian Fitting Function to carry out Gaussian fitting on the fitting data acquired from thesecond step, so that the value of Gaussian Fitting Function is obtained; fourth, deriving the Gaussian Fitting Function value obtained from the third step, setting the derivative function as zero-theGaussian fitting peak that corresponds to the sub-pixel position. The method further improves the precision of the refractive index measurement based on the features of automatic and fast refractiveindex measuring of the photoelectric array device.
Description
technical field [0001] The invention belongs to the field of measurement and optics, and more specifically relates to a Gaussian fitting sub-pixel position extraction method based on the measurement of refractive index by a photoelectric sensor array. Background technique [0002] The refractive index is an important parameter reflecting the optical properties of the medium. There are various measurement methods proposed so far. The more representative methods include the traditional Abbe refractometer, optical fiber sensing technology, array device measurement of refractive index technology and surface plasmon Resonance (SPR) technology. [0003] Among these technologies, SPR has high measurement accuracy, general anti-interference ability of the optical path, and high requirements for optical components such as sensitive chips. The Abbe refractometer is based on the principle of the critical angle method, has high reliability and high precision, and is widely used in vari...
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IPC IPC(8): G01N21/41
CPCG01N21/4133
Inventor 郭文平罗运夏珉杨克成李微
Owner HUAZHONG UNIV OF SCI & TECH