Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A method for self-adaptive exposure of short-wave infrared detector

A technology of short-wave infrared and exposure method, which is applied to TV, color TV parts, electrical components, etc. It can solve the problems of repeated image vibration, image mutation, and poor image quality, so as to achieve small calculation amount, avoid image mutation phenomenon, The effect of avoiding the repeated vibration phenomenon of the image

Active Publication Date: 2019-01-04
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI +1
View PDF7 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In order to solve the problem that the output image quality of the existing short-wave infrared adaptive exposure algorithm is poor, and it will cause image mutation and repeated image vibration when the exposure time is switched, the present invention provides a short-wave infrared detector adaptive exposure method, according to the detection The statistical average of the gray level in the center area of ​​the sensor output, adaptively adjust the gain and exposure time of the short-wave infrared detector

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A method for self-adaptive exposure of short-wave infrared detector
  • A method for self-adaptive exposure of short-wave infrared detector
  • A method for self-adaptive exposure of short-wave infrared detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039] The following is attached Figure 1-5 The present invention is further described.

[0040] like Figure 1-2 As shown, the adaptive exposure method of the short-wave infrared detector of the present invention is specifically as follows:

[0041] Step 1) Set the target output gray scale of the short-wave infrared detector to 112-144; considering that the output gray scale range of the short-wave infrared detector is 0-255, the target output gray scale is best set to 128 (half of the full gray scale range ), which is the gray level most suitable for human eyes to recognize images at this time;

[0042] Step 2) Calculate the difference between the central area grayscale statistical average of the SWIR detector output image and the target output grayscale, and when the central area grayscale statistical average is less than the target output grayscale, the difference Denoted as delta_1, when the statistical average value of the central region grayscale is greater than the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

In order to solve the problems that the output image quality of the existing short-wave infrared adaptive exposure algorithm is poor, and the image sudden change and the image repeated oscillation will be caused when the exposure time slot is switched, the invention provides a method for self-adaptive exposure of a short-wave infrared detector, which comprises the following steps: 1) setting a target output gray value; 2) calculating a difference between the gray level statistical average value of the center area of a detector output image and a target output gray value; 3) according to the difference value, setting three judgment threshold values in the exposure increasing direction and the exposure decreasing direction respectively; 4) setting an exposure increasing direction threshold value and an exposure decreasing direction threshold value; 5) adjusting the exposure gain and the exposure time until the statistical average value of the gray level of the center region is equal to the target output gray level value. The exposure time change of the invention has three step lengths, the sudden change phenomenon of the image when the exposure time is adjusted can be effectively avoided; different judging grey thresholds can be utilized in adjustment in an exposure increasing direction and an exposure decreasing direction, which can effectively avoid repeated image oscillation during exposure adjustment.

Description

technical field [0001] The invention belongs to the field of short-wave infrared thermal imaging, and relates to an adaptive exposure method of a short-wave infrared detector. Background technique [0002] In the field of short-wave infrared thermal imaging, it is necessary to dynamically adjust the exposure time of the short-wave infrared detector according to the change of illumination in different scenes, so that the output image of the short-wave infrared detector is always in a suitable gray level. [0003] The adaptive exposure algorithms currently used by short-wave infrared detectors mainly include the average gray level adaptive exposure algorithm and the gray level histogram statistical adaptive exposure algorithm. [0004] The average gray scale adaptive exposure algorithm first calculates the gray average value of the current entire image, and compares the obtained gray average value of the current entire image with the set target gray value, thereby dynamically ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04N5/235H04N5/33
CPCH04N5/33H04N23/73
Inventor 段程鹏陈耀弘刘庆谢庆胜王华伟曹剑中
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products