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Fast automatic exposure method and system based on display panel defect detection

A technology for displaying panel defects and automatic exposure, which is applied to control exposure, TV system components, optics, etc., to achieve the effects of fast computing speed, improved effectiveness, and increased robustness

Active Publication Date: 2020-11-03
WUHAN JINGCE ELECTRONICS GRP CO LTD
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0006] The purpose of the present invention is to address the defects of the prior art, to provide a fast automatic exposure method based on display panel defect detection that can quickly expose and effectively eliminate the adverse effects of screen defects and screen brightness unevenness on automatic exposure. and system

Method used

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  • Fast automatic exposure method and system based on display panel defect detection
  • Fast automatic exposure method and system based on display panel defect detection
  • Fast automatic exposure method and system based on display panel defect detection

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Embodiment Construction

[0067] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments to facilitate a clear understanding of the present invention, but they do not limit the present invention.

[0068] Such as figure 1 As shown, the process of a fast automatic exposure method based on display panel defect detection in the present invention is as follows:

[0069] Step 1: Set the camera's initial exposure time initT and initial gain initG, and set the target brightness Y0 of each frame to be detected.

[0070] Step 2: Collect the screen image of the display screen with an actual gray value of 255, and extract the ROI area from the screen image of the display screen. First, according to the collected display screen image (for example, L255 screen) with an actual gray value of 255, image threshold segmentation is performed to obtain the ROI segmentation parameters of the screen (for subsequent image acquisition and ROI extr...

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Abstract

The invention relates to the technical field of panel detection, in particular to a fast automatic exposure method and system based on display panel defect detection. Extract the screen ROI area from the screen image of the display screen; calculate the exposure parameters of the screen to be detected on the display panel according to the gamma relationship between the screen brightness and the gray scale of the screen; adjust the camera exposure time and Gain, collect the screen corresponding to the screen to be detected, and judge whether the screen brightness is qualified; if the screen brightness is qualified, switch to the next screen to be detected for exposure parameter calculation. Create a gamma screen to calculate the actual gamma parameters of the screen, and then use the actual screen gamma parameters to predict the camera exposure parameters of each grayscale screen, which can effectively achieve the automatic exposure effect at one time, with fast calculation speed and strong real-time performance.

Description

technical field [0001] The invention relates to the technical field of panel detection, in particular to a fast automatic exposure method and system based on display panel defect detection. Background technique [0002] For the display panel visual inspection system, the high-quality image of the panel is the basis for subsequent image processing and defect analysis, which is directly related to the measurement accuracy of the entire system, and in the case of a certain imaging device, exposure is one of the key factors affecting the imaging quality one. Manual control of exposure has defects such as low efficiency and lack of objective evaluation standards. [0003] In the existing automatic exposure technology of panel visual inspection, the industrial camera performs automatic exposure. According to the expected brightness range, the relationship between camera brightness, exposure and gain is used, and the strategy of rapid approximation of multiple exposures is used to...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04N5/235H04N5/202G03B7/00
CPCH04N5/202G03B7/00H04N23/73
Inventor 余梦露张胜森李苗郑增强
Owner WUHAN JINGCE ELECTRONICS GRP CO LTD
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