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External noise injection-based rapid calibration method for millimeter wave interferometric comprehensive aperture imaging system

An imaging system, external noise technology, applied in radio wave measurement systems, instruments, etc., can solve problems such as long calibration time

Active Publication Date: 2019-01-11
BEIHANG UNIV
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Problems solved by technology

[0008] The technical problem of the present invention is: to solve the problem of long calibration time of the existing synthetic aperture calibration method, to provide a rapid calibration method of the millimeter-wave interferometric synthetic aperture imaging system based on external noise injection, using external noise point sources and surface The source calibrates the autocorrelation and cross-correlation responses of the imaging system under test respectively. The calibration speed is fast to meet the needs of daily use, and the position factor of the calibration noise point source in the calibration data is eliminated through the positioning relationship during the calibration process. After calibration, the imaging system under test can be Realize multi-distance imaging, ensuring its requirements for multi-distance tracking imaging

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  • External noise injection-based rapid calibration method for millimeter wave interferometric comprehensive aperture imaging system
  • External noise injection-based rapid calibration method for millimeter wave interferometric comprehensive aperture imaging system
  • External noise injection-based rapid calibration method for millimeter wave interferometric comprehensive aperture imaging system

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Embodiment Construction

[0096] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0097] Such as figure 1 Shown, the inventive method is concretely realized as follows:

[0098] The first step is to use the external point noise source calibration method to calibrate the phase error of the cross-correlation value of each channel of the millimeter-wave interferometric synthetic aperture imaging system

[0099] (1) The external point noise source is composed of a matching load and a low noise amplifier. The bandwidth of the low noise amplifier is greater than the operating bandwidth of the imaging system under test to ensure that the broadband noise radiated by the external point noise source can cover the operating frequency band of the imaging system under test, and ensure that the external point noise The fluctuation of the broadband noise radiated by the noise source is less than 1dB; the external point noise source is connecte...

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Abstract

The invention provides an external noise injection-based rapid calibration method for a millimeter wave interferometric comprehensive aperture imaging system. The method comprises the steps that basedon an external point radiation noise source, a phase consistency error of cross-correlation value measurement in the millimeter wave interferometric comprehensive aperture imaging system is calibrated; an amplitude consistency error of an auto-correlation value in the millimeter wave interferometric comprehensive aperture imaging system is calibrated on the basis of the temperature difference ofa surface noise source; and in combination with calibration results of the point noise source and the surface noise source, a relation between the amplitude consistency error of a cross-correlation measurement value and the consistency error of the auto-correlation value is deduced, so that the amplitude consistency error of the cross-correlation measurement value is calibrated. According to the method, rapid measurement and calibration of the amplitude and phase consistency errors of the millimeter wave interferometric comprehensive aperture imaging system can be realized, and rapid calibration requirement of the millimeter wave interferometric comprehensive aperture imaging system is met.

Description

technical field [0001] The invention relates to the field of millimeter wave imaging system calibration, specifically, a rapid calibration method for a millimeter wave interferometric synthetic aperture imaging system. Background technique [0002] The millimeter-wave interferometric synthetic aperture imaging system is used in the field of rapid imaging for human body security inspection. Millimeter wave is an electromagnetic wave frequency band suitable for imaging security inspection, and it is the working frequency band selected by most of the human body security inspection equipment that has been used so far. Its frequency is between microwave and terahertz. It has the characteristics of strong penetration of objects and clothing in the microwave frequency band, and also has the advantage of terahertz high resolution, which is suitable for human body security inspection. Interferometric synthetic aperture imaging belongs to the passive imaging field in millimeter wave ...

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Application Information

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IPC IPC(8): G01S7/40
CPCG01S7/40
Inventor 苗俊刚胡岸勇刘凯
Owner BEIHANG UNIV