Micro-controller pin parameter automatic test platform and test method
An automatic test, microcontroller technology, applied in the direction of instruments, measuring electricity, measuring devices, etc., can solve the problems of circuit construction, time-consuming debugging, limited test data accuracy, large deviation of test results, etc., to reduce test data. Effects of logging errors, increased test data points, less test time
Pending Publication Date: 2019-01-25
上海菱沃铂智能技术有限公司
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Problems solved by technology
[0003] The test process is complicated: the circuit needs to be rebuilt before each test, and the circuit principles of different parameter tests are different, so the construction, debugging and operation of the test process are time-consuming, and the testers also need to have relevant professional knowledge and good Psychological quality to complete this test
[0004] Expensive testing costs: Some failure analysis curves need to be tested manually if a large amount of data is tested, the test is more complicated, and the test results have large deviations. In this case, the test will be tested by other test manufacturers with precision instruments, but the test cost Expensive, generally only used when analyzing special problems
[0005] Limited test accuracy: Some parameter tests are greatly affected by the environment and operating procedures when the measuring instruments are the same, which limits the accuracy of the test data
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[0032] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.
[0033] The invention adopts microcomputer technology to control various precise experimental instruments and equipment to simulate the flow of manual testing to realize the automatic testing of micro-controller pin parameters, and uploads the test data to the computer to generate a file report after processing.
[0034] The measuring instruments used in this solution include six-and-a-half-digit digital multimeters, programmable electronic loads, and progra...
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The invention relates to a micro-controller pin parameter automatic test platform and test method. The platform is connected with a chip under test. The test platform comprises a digital multimeter, an electronic load, a digital power source and an IO pin automatic test platform control board; the IO pin automatic test platform control board is connected with the digital multimeter and the chip under test; the digital multimeter is connected with the electronic load, the digital power source and the chip under test through relay switches; the electronic load is connected with the IO pin automatic test platform control board; and the digital power source is connected with the digital power source and the chip under test through relay switches. Compared with the prior art, the micro-controller pin parameter automatic test platform and test method of the invention does not need to rebuild a test circuit every time when test is performed, thereby simplifying a test flow.
Description
technical field [0001] The invention relates to a micro-controller pin parameter testing technology, in particular to an automatic testing platform and a testing method for a micro-controller pin parameter. Background technique [0002] At present, the microcontroller pin parameter test is basically to manually build a good circuit and then use related measuring instruments to measure. The main shortcomings are as follows: [0003] The test process is complicated: the circuit needs to be rebuilt before each test, and the circuit principles of different parameter tests are different, so the construction, debugging and operation of the test process are time-consuming, and the testers also need to have relevant professional knowledge and good Psychological quality to complete this test work. [0004] Expensive testing costs: Some failure analysis curves need to be tested manually if a large amount of data is tested, the test is more complicated, and the test results have large...
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IPC IPC(8): G01R31/00G01R19/00
CPCG01R19/00G01R31/00
Inventor 梁青武冯兵熊峰张泳
Owner 上海菱沃铂智能技术有限公司