Test circuit for infrared receiving head

A technology of infrared receiving head and test circuit, which is applied in the direction of electrical connection test, measurement of electricity, and measurement of electrical variables, etc., which can solve the problems of large error in manual reading, low test efficiency, and long time consumption, and improve the degree of automation , increase the test time, easy to use effect

Active Publication Date: 2019-01-25
SHENZHEN SKYWORTH DIGITAL TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] This method of testing mainly relies on people. Not only is the test efficiency low, but the error in manual reading...

Method used

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  • Test circuit for infrared receiving head
  • Test circuit for infrared receiving head
  • Test circuit for infrared receiving head

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0039] figure 1 This is a block diagram of a test circuit of an infrared receiving head provided in Embodiment 1 of the present invention. The test circuit of the infrared receiving head in this embodiment is used to perform compatibility testing on the infrared receiving head during material replacement. The test circuit of the infrared receiving head in this embodiment includes an infrared transmitting module 11 , an infrared receiving module 12 and a control module 13 .

[0040] The infrared emission module 11 is used for time-sharing to transmit a plurality of infrared emission signals of different intensities. In this embodiment, the infrared emitting module 11 at least includes one or more infrared emitters that emit or emit external light. The working current of the infrared transmitter can be adjusted through a preset time interval, such as 10 seconds or 20 seconds, so that the infrared transmitter can send infrared emission signals of different intensities outward to...

Embodiment 2

[0046] figure 2 This is a block diagram of a test circuit of an infrared receiving head provided by the second embodiment of the present invention. The test circuit of the infrared receiving head in this embodiment provides different resistances to control the intensity of the infrared emission signal, so as to realize the detection of the infrared receiving head in the material. Compatibility testing during replacement. The test circuit of the infrared receiving head in this embodiment includes an infrared transmitting module 11 , an infrared receiving module 12 and a control module 13 .

[0047] The infrared emission module 11 includes a resistance module 111 and an infrared transmitter 112 . The resistance module 111 is used for providing various resistances with different resistance values, and one end of the resistance module 111 is connected to the infrared transmitter 112 . In this embodiment, the resistor module 111 is a plurality of resistors with different resistan...

Embodiment 3

[0054] Figure 5 This is a block diagram of a test circuit of an infrared receiving head provided by the third embodiment of the present invention. The test circuit of the infrared receiving head in this embodiment provides a display device for displaying the compatibility test of the infrared receiving head during the material replacement process. result. The test circuit of the infrared receiving head in this embodiment includes an infrared transmitting module 11 , an infrared receiving module 12 , a control module 13 and a display device 14 .

[0055] The infrared receiving module 12 includes a detection circuit board 121, and the detection circuit board 121 is used for detachably connecting at least one infrared receiving head to be tested. In this embodiment, the infrared receiving heads to be tested are three IR1-IR3.

[0056] The infrared emission module 11 includes a resistance module 111 , an infrared transmitter 112 and a switch module 113 .

[0057] The resistor m...

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Abstract

An embodiment of the invention discloses a test circuit for an infrared receiving head. The test circuit comprises an infrared transmitting module, an infrared receiving module and a control module, wherein the infrared transmitting module is used for transmitting a plurality of infrared transmission signals with different intensities in a time sharing manner; the infrared receiving module is configured to connect the infrared receiving head to be tested, and the infrared receiving head to be tested receives the plurality of infrared transmission signals with different intensities to generatedifferent pulse signals; and the control module is configured to control the infrared transmitting module to operate and receive the pulse signals, and the control module detects the widths of the pulse signals and displays the widths. The test circuit for the infrared receiving head disclosed by the invention is simple and convenient.

Description

technical field [0001] The embodiments of the present invention relate to the field of electronic product detection, and in particular, to a test circuit of an infrared receiving head. Background technique [0002] As an input device of electronic products, infrared receivers are widely used in various electronic products, such as remote controls for home appliances. Although a new generation of short-range communication and control technologies, such as Bluetooth technology, has become popular in remote controls, due to the simple, fast response and low cost characteristics of the corresponding codec function module of infrared remote control, it still occupies the top spot in household consumer products so far. The majority of the market share of remote controls. [0003] In the life cycle of electronic products, the use of any component except the main control chip cannot be a single supplier. Considering the reasons such as cost, quality or supply capacity, new electron...

Claims

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Application Information

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IPC IPC(8): G01R31/04
CPCG01R31/66
Inventor 李伟张万里
Owner SHENZHEN SKYWORTH DIGITAL TECH CO LTD
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