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Parallel structure, manufacturing method thereof, and electronic equipment including the parallel structure

A parallel and conductive channel technology, which is applied in semiconductor/solid-state device manufacturing, circuits, electrical components, etc., can solve problems such as the difficulty of forming transistor interconnections, and achieve the effects of saving area, eliminating offset, and reducing occupied area

Active Publication Date: 2020-06-30
INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the formation of interconnections between transistors is difficult

Method used

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  • Parallel structure, manufacturing method thereof, and electronic equipment including the parallel structure
  • Parallel structure, manufacturing method thereof, and electronic equipment including the parallel structure
  • Parallel structure, manufacturing method thereof, and electronic equipment including the parallel structure

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Embodiment Construction

[0011] Hereinafter, embodiments of the present disclosure will be described with reference to the drawings. It should be understood, however, that these descriptions are exemplary only, and are not intended to limit the scope of the present disclosure. Also, in the following description, descriptions of well-known structures and techniques are omitted to avoid unnecessarily obscuring the concepts of the present disclosure.

[0012] Various structural schematic diagrams according to embodiments of the present disclosure are shown in the accompanying drawings. The figures are not drawn to scale, with certain details exaggerated and possibly omitted for clarity of presentation. The shapes of the various regions and layers shown in the figure, as well as their relative sizes and positional relationships are only exemplary, and may deviate due to manufacturing tolerances or technical limitations in practice, and those skilled in the art will Regions / layers with different shapes, ...

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Abstract

Disclosed are a parallel structure, a manufacturing method thereof, and electronic equipment including the parallel structure. The parallel structure includes alternately stacked source / drain layers and channel layers on the substrate, and gate stacks respectively formed around at least part of the periphery of each channel layer. Each channel layer, source / drain layers on its upper and lower sides, and gate stacks formed around it constitute a corresponding semiconductor device. In each semiconductor device, one of the source / drain layers on the upper and lower sides of the corresponding channel layer is in contact with the first conductive channel arranged on the outer periphery of the active region, and the other source / drain layer is in contact with the first conductive channel arranged on the outer periphery of the active region. The two conductive channels are in contact, and the gate stack formed around the channel layer is in contact with the third conductive channel disposed on the periphery of the active region. The first conductive path is common to all semiconductor devices, the second conductive path is common to all semiconductor devices, and the third conductive path is common to all semiconductor devices.

Description

technical field [0001] The present disclosure relates to the field of semiconductors, and more particularly, to a compact parallel structure of a semiconductor device, a method of manufacturing the same, and an electronic device including such a parallel structure. Background technique [0002] Vertical devices have good device characteristics, such as good electrostatic properties, good control of short channel effects, small sub-threshold swing, and resulting low power consumption. This enables further scaling of the device to increase integration density. In some applications it is necessary to connect several transistors in parallel, for example in order to obtain a large drive current to drive other devices. These transistors can be stacked vertically to save area. However, the formation of interconnections between transistors is difficult. Contents of the invention [0003] In view of this, it is an object of the present disclosure to provide, at least in part, a ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L23/52H01L21/77
CPCH01L23/52H01L21/77H01L27/088H01L29/7827H01L29/7391H01L29/66666H01L29/66356H01L29/66545H01L29/41741H01L29/0653H01L29/78642H01L21/8221H01L21/823487H01L21/823418H01L27/0688H01L25/0657H01L25/50H01L29/66712H01L29/7802
Inventor 朱慧珑
Owner INST OF MICROELECTRONICS CHINESE ACAD OF SCI