Unlock instant, AI-driven research and patent intelligence for your innovation.

Anisotropic microscopic imaging method and device of low-dimensional materials

A technology of anisotropic, low-dimensional materials, applied in the direction of polarization influence characteristics, etc., can solve the problems of inaccurate test results, inability to meet the requirements at the same time, and unreliable test results.

Pending Publication Date: 2019-02-15
NANKAI UNIV
View PDF13 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, the most widely used methods for studying the anisotropy of low-dimensional materials cannot meet our needs for efficiency, simplicity, precision and sample non-destructiveness at the same time.
Angle-resolved Raman spectroscopy can be used to study the anisotropy of materials by analyzing the polarization-dependent changes in different vibration modes. Application; scanning transmission electron microscopy can be used to determine the crystal orientation of samples with high precision, but it has special requirements for sample thickness and substrate, and cannot be widely used; photothermal detection technology has been proven to observe the anisotropy of materials, but when using samples It needs to be immersed in liquid, and the material cannot be used after the measurement, which limits its application; currently, the easiest way is to use a polarizing microscope to observe the optical anisotropy of the material in the visible light band. However, since the measurement process involves manually rotating the sample, Its test results are often unreliable
There are also some studies that use rotating polarizers to measure, but due to the influence of beam splitters, the test results are often inaccurate
At present, a method that can intuitively observe the anisotropy of materials and measure the crystal orientation of anisotropic low-dimensional materials in a simple, fast, non-destructive and accurate way is still lacking.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Anisotropic microscopic imaging method and device of low-dimensional materials
  • Anisotropic microscopic imaging method and device of low-dimensional materials
  • Anisotropic microscopic imaging method and device of low-dimensional materials

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0017] Anisotropic Microscopic Imaging of Black Phosphorus

[0018] Such as figure 2 As shown in a, first prepare a few layers of black phosphorus on the silicon wafer by mechanical peeling method, and take pictures as figure 2 A series of angle-resolved polarized optical images shown in b. Due to the strong in-plane optical anisotropy of the black phosphorus sample, the reflected light intensity will change significantly when the polarization state changes. By extracting the difference between the maximum and minimum values ​​of the same pixel in a series of polarized optical images acquired, and displaying the angle corresponding to the maximum value in the form of an arrow, we get as follows figure 2 In the intensity domain anisotropy image shown in c, it is obvious that the stronger the anisotropy is, the brighter the area is, and the arrows are more orderly, which provides great convenience for us to directly observe the anisotropy of the material and determine the c...

Embodiment 2

[0020] image 3 a shows silver nanowires spin-coated on a quartz substrate. Silver nanowires have nanometer scales in the horizontal line and micrometer scales in the vertical direction. This structure makes them have strong optical anisotropy. We use the intensity-domain and angle-domain anisotropy imaging to get the following image 3 b and image 3 Anisotropic image of c. It is obvious that the anisotropic image in the intensity domain has much more details than the original optical image, as shown by the red and gray arrows, and the contrast is significantly improved compared with the original image. At the same time, in the anisotropy image in the angle domain, nanowires with different orientations have different colors, so that their polarization directions can be easily seen.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an anisotropic microscopic imaging method of low-dimensional materials, which is based on a microscopic device using a non-polarization spectrometry and the anisotropic absorption effect of low-dimensional materials, so as to study the variation of the reflected light intensity on the surface of the low-dimensional materials under different polarization states. The method comprises the following steps of: acquiring a series of angularly resolved polarized optical images of small angular intervals by an automatic image acquisition and analysis program; extracting the maximum and minimum light intensity values of the same pixel point of all polarized optical images one by one and corresponding rotation angles thereof, and drawing the difference between the maximum andminimum light intensity values of each pixel point by point into another image, so that the anisotropic microscopic image of an intensity domain is obtained; at the same time, drawing an angle valuecorresponding to the maximum reflected light intensity extracted at each pixel point into another image by an arrow or a different color, and the anisotropic microscopic image of the angle domain is obtained. The method and device is suitable for studying the optical anisotropy of different low-dimensional materials such as black phosphorus, rhenium disulfide, silver nanowires and carbon nanotubes.

Description

technical field [0001] The invention belongs to the technical field of low-dimensional materials and anisotropic microscopic imaging, and relates to a method and device for anisotropic microscopic imaging of low-dimensional materials by combining non-polarization spectroscopic technology and anisotropic absorption effect. Background technique [0002] Anisotropy refers to the difference in mechanical, electrical, thermal, and optical properties of materials due to the hybridization and arrangement of atoms in different directions. Black phosphorus, rhenium disulfide, rhenium diselenide, carbon nanotubes, and silver nanowires have obvious anisotropy. The anisotropy of low-dimensional materials can add a tunable degree of freedom to their optoelectronic applications, such as integrated digital inverters, orientation-dependent diodes, highly sensitive linearly polarized light detectors, and low-light detection device etc. To use the anisotropy of materials more flexibly, the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/21
CPCG01N21/21
Inventor 刘智波黄凯旋田建国
Owner NANKAI UNIV