Supercharge Your Innovation With Domain-Expert AI Agents!

Semiconductor structure and manufacturing method thereof

A manufacturing method and semiconductor technology, which can be applied in the direction of semiconductor devices, electrical components, circuits, etc., can solve problems such as the decrease of reliability of semiconductor devices.

Active Publication Date: 2021-04-09
VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Although the semiconductor integrated circuit industry has made many developments aimed at reducing the size of components, however, as the size of the smallest components continues to shrink, many challenges arise
For example, as the trench width shrinks (or the aspect ratio increases), defects such as voids or vias may form in the material within the trench, resulting in reduced reliability of the semiconductor device

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor structure and manufacturing method thereof
  • Semiconductor structure and manufacturing method thereof
  • Semiconductor structure and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0037] The semiconductor structure with doped semiconductor material filled in the trench and the manufacturing method thereof are described below for some embodiments of the present invention. It should be appreciated that the following description provides many different embodiments or examples for implementing different aspects of some embodiments of the invention. The specific components and arrangements described below are intended to simply describe the embodiments of the present invention. Of course, these are only examples and not intended to limit the present invention. Furthermore, repeated reference numerals or designations may be used in different embodiments. These repetitions are only for the purpose of simply and clearly describing the embodiments of the present invention, and do not represent the relationship between different embodiments and / or structures discussed. Furthermore, when referring to a first element being on or over a second element, embodiments...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention proposes a semiconductor structure and a manufacturing method thereof, wherein the manufacturing method of the semiconductor structure includes providing a semiconductor substrate, forming a trench in the semiconductor substrate, filling the trench with a first semiconductor material, and the first semiconductor material does not have a dopant , forming a second semiconductor material on the first semiconductor material, the second semiconductor material contains dopants, and performing heat treatment, so that the dopants in the second semiconductor material diffuse into the first semiconductor material to form a doped The third semiconductor material is in the trench. In the semiconductor structure formed by the semiconductor structure manufacturing method of the present invention, pores or channels will not be formed in the semiconductor material in the trench, and the doped semiconductor material will be formed in the trench after heat treatment, thereby avoiding subsequent processes. The problem caused by the flow of the material used in the trench into the pores or channels of the doped semiconductor material in the trench, thus improving the reliability of the semiconductor device.

Description

technical field [0001] Embodiments of the present invention relate to semiconductor manufacturing technology, and in particular to a semiconductor structure with a doped semiconductor material filled in a trench and a manufacturing method thereof. Background technique [0002] The semiconductor integrated circuit industry has experienced rapid growth over the past few decades. Advances in semiconductor materials and manufacturing techniques have resulted in smaller and smaller components and more complex fabrication. Advances in miniaturization and performance enhancement of semiconductor elements have been achieved due to advances in semiconductor process technology. In the course of the development of semiconductor manufacturing, since the size of the smallest element that can be reliably manufactured is getting smaller and smaller, the number of interconnectable elements per unit area is increasing. [0003] In order to effectively reduce the size of semiconductor compo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/28H01L29/423H01L29/06
CPCH01L29/0638H01L29/401H01L29/4236
Inventor 高志明吴荣根张翰文陈俊旭何游俊
Owner VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More