Alignment method, alignmenet apparatus, vacuum evaporation method and vacuum evaporation apparatus
A technology for alignment marks and detection methods, applied in vacuum evaporation coating, measuring devices, using optical devices, etc.
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[0031] Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. The present invention can be modified variously, and can have various embodiments. Although specific examples are illustrated based on the drawings, the present invention is not limited to the specific examples, and it should be understood that all changes, equivalents, and substitutions included in the spirit and scope of the present invention are included.
[0032]The present invention relates to a film forming apparatus for forming a thin film on a substrate and a control method thereof, and particularly relates to a technology for high-precision conveyance and position adjustment of a substrate. The present invention can be preferably applied to an apparatus for forming a thin film (material layer) of a desired pattern by vacuum evaporation on the surface of a parallel plate substrate. Also, any material such as glass, resin, or metal can be selected as the...
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